Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4231
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dc.contributorDepartment of Electronic and Information Engineering-
dc.creatorZheng, Y-
dc.creatorWang, B-
dc.creatorWoo, CH-
dc.date.accessioned2014-12-11T08:24:31Z-
dc.date.available2014-12-11T08:24:31Z-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10397/4231-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Y. Zheng, B. Wang & C. H. Woo, Appl. Phys. Lett. 89, 062904 (2006) and may be found at http://apl.aip.org/resource/1/applab/v89/i6/p062904_s1en_US
dc.subjectFerroelectric thin filmsen_US
dc.subjectPyroelectricityen_US
dc.subjectInternal stressesen_US
dc.subjectDielectric polarisationen_US
dc.subjectDielectric hysteresisen_US
dc.titleEffects of strain gradient on charge offsets and pyroelectric properties of ferroelectric thin filmsen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: C. H. Wooen_US
dc.identifier.spage1-
dc.identifier.epage3-
dc.identifier.volume89-
dc.identifier.issue6-
dc.identifier.doi10.1063/1.2335369-
dcterms.abstractThe Landau-Ginzburg-Devonshire theory is used to study the effects of the strain gradient due to the epitaxial stresses in ferroelectric thin films sandwiched between two different substrates. The polarization in the film is found to be nonuniform, resulting in charge offsets and an asymmetric hysteresis response with characteristics similar to those in compositionally graded ferroelectric materials. The authors’ results suggest that the charge offset and pyroelectric effects can also be produced with effect of the strain gradient in film. In addition, such effects are found to be sensitive to an applied load.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 7 Aug. 2006, v. 89, no. 6, 062904, p. 1-3-
dcterms.isPartOfApplied physics letters-
dcterms.issued2006-08-07-
dc.identifier.isiWOS:000239690800077-
dc.identifier.scopus2-s2.0-33747126805-
dc.identifier.eissn1077-3118-
dc.identifier.rosgroupidr28275-
dc.description.ros2005-2006 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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