Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4214
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dc.contributorDepartment of Electronic and Information Engineering-
dc.creatorBa, L-
dc.creatorShu, J-
dc.creatorLu, Z-
dc.creatorLi, J-
dc.creatorLei, W-
dc.creatorWang, B-
dc.creatorLi, WS-
dc.date.accessioned2014-12-11T08:24:26Z-
dc.date.available2014-12-11T08:24:26Z-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10397/4214-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in L. Ba et al., J. Appl. Phys. 93, 9977 (2003) and may be found at http://link.aip.org/link/?jap/93/9977.en_US
dc.subjectCarbon nanotubesen_US
dc.subjectArraysen_US
dc.subjectAtomic force microscopyen_US
dc.subjectElectron field emissionen_US
dc.subjectElectric field gradienten_US
dc.titleProbing local electric field distribution of nanotube arrays using electrostatic force microscopyen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: Waisang Lien_US
dc.identifier.spage9977-
dc.identifier.epage9982-
dc.identifier.volume93-
dc.identifier.issue12-
dc.identifier.doi10.1063/1.1571963-
dcterms.abstractThe local electric field distribution of nanotube arrays has been studied by using the electrostatic force microscopy (EFM) technique. The nanotube arrays were fabricated using the anodic alumina template method. Good electric contact has been proofed using contact mode conductive atomic force microscopy. The experiment shows that the EFM can provide a quantitative mapping tool to measure three-dimensional distribution of local electric field with resolution down to several nanometers. The finite difference method has been applied to calculate the electric field distribution near the surface of the nanotube array induced by a conductive tip. The results show that the field decays in a power law with exponent varies for nanotubes of different packing environments as the tip was lifted away from the top of nanotubes. The protrusion of nanotubes causes a much higher enhanced field than packing geometry. Medium packing density may enable the maximum collective emission current for such nanotube arrays of narrow diameter and height diversity.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationJournal of applied physics, 15 June 2003, v. 93, no. 12, p. 9977-9982-
dcterms.isPartOfJournal of applied physics-
dcterms.issued2003-06-15-
dc.identifier.isiWOS:000183288900087-
dc.identifier.scopus2-s2.0-0037805566-
dc.identifier.eissn1089-7550-
dc.identifier.rosgroupidr12174-
dc.description.ros2002-2003 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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