Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/420
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dc.contributorDepartment of Applied Physics-
dc.contributorMaterials Research Centre-
dc.creatorTian, Hen_US
dc.creatorWang, Yen_US
dc.creatorWang, Den_US
dc.creatorMiao, Jen_US
dc.creatorQi, Jen_US
dc.creatorChan, HLWen_US
dc.creatorChoy, CLen_US
dc.date.accessioned2014-12-11T08:27:40Z-
dc.date.available2014-12-11T08:27:40Z-
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://hdl.handle.net/10397/420-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in H. Tian et al. Appl. Phys. Lett. 89, 142905 (2006) and may be found at http://link.aip.org/link/?apl/89/142905en_US
dc.subjectBarium compoundsen_US
dc.subjectStrontium compoundsen_US
dc.subjectBismuth compoundsen_US
dc.subjectZinc compoundsen_US
dc.subjectComposite materialsen_US
dc.subjectFerroelectric thin filmsen_US
dc.subjectPulsed laser depositionen_US
dc.subjectX-ray diffractionen_US
dc.subjectPermittivityen_US
dc.subjectDielectric lossesen_US
dc.titleDielectric properties and abnormal C-V characteristics of Ba₀.₅Sr₀.₅TiO₃-Bi₁.₅ZnNb₁.₅O₇ composite thin films grown on MgO (001) substrates by pulsed laser depositionen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage1en_US
dc.identifier.epage3en_US
dc.identifier.volume89en_US
dc.identifier.doi10.1063/1.2358934en_US
dcterms.abstractHighly c-axis oriented Ba[sub 0.5]Sr[sub 0.5]TiO₃-based composite thin films were grown on MgO (001) single-crystal substrates by pulsed laser deposition and the in-plane dielectric properties of the films evaluated. X-ray diffraction characterization revealed a good crystallinity. The dielectric constant and loss were found to be 200 and 0.001-0.007 at room temperature, respectively. The butterfly-shaped C-V characteristic curve evidenced an enhanced in-plane dielectric tunability of >90% in the films at 1 MHz under a dc bias field of 0.8 MV/cm. A brief discussion is given on the abnormal C-V curves. Various tunable microwave applications of Ba[sub 0.5]Sr[sub 0.5]TiO₃-Bi[sub 1.5]ZnNb[sub 1.5]O[sub 7] composite thin films are expected.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 2 Oct. 2006, v. 89, 142905, p. 1-3en_US
dcterms.isPartOfApplied physics lettersen_US
dcterms.issued2006-10-02-
dc.identifier.isiWOS:000241056900081-
dc.identifier.scopus2-s2.0-33749479733-
dc.identifier.eissn1077-3118en_US
dc.identifier.rosgroupidr30430-
dc.description.ros2006-2007 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRA-
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryVoR alloweden_US
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