Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/412
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dc.contributorDepartment of Applied Physics-
dc.contributorMaterials Research Centre-
dc.creatorSun, Cen_US
dc.creatorLam, KHen_US
dc.creatorChao, Cen_US
dc.creatorLau, STen_US
dc.creatorChan, HLWen_US
dc.creatorGuo, Sen_US
dc.creatorZhao, Xen_US
dc.date.accessioned2014-12-11T08:27:34Z-
dc.date.available2014-12-11T08:27:34Z-
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://hdl.handle.net/10397/412-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in C.-L. Sun et al., Appl. Phys. Lett. 90, 253107 (2007) and may be found at http://link.aip.org/link/?apl/90/253107.en_US
dc.subjectNickelen_US
dc.subjectFerroelectric materialsen_US
dc.subjectPolymersen_US
dc.subjectNanowiresen_US
dc.subjectNanotubesen_US
dc.subjectComposite materialsen_US
dc.subjectCoaxial cablesen_US
dc.subjectCapacitanceen_US
dc.subjectDielectric polarisationen_US
dc.subjectScanning electron microscopyen_US
dc.subjectX-ray diffractionen_US
dc.subjectNanotechnologyen_US
dc.titleFabrication and characterization of Ni/P(VDF-TrFE) nanoscaled coaxial cablesen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: Kwo Ho Lamen_US
dc.description.otherinformationAuthor name used in this publication: Cheng-Liang Sunen_US
dc.description.otherinformationAuthor name used in this publication: Helen Lai Wa Chanen_US
dc.identifier.spage1en_US
dc.identifier.epage3en_US
dc.identifier.volume90en_US
dc.identifier.doi10.1063/1.2750391en_US
dcterms.abstractThe authors have prepared poly(vinylidenefluoride-trifluoroethylene) Ni/P(VDF-TrFE) nanoscaled coaxial cables with Ni nanowires as the cores and P(VDF-TrFE) nanotubes as the shells by a two-step process. Scanning electron microscope and x-ray diffraction measurements revealed the microstructure and crystallinity of the nanocables. Electrical measurements indicated that the nanocables possessed a large specific capacitance (~10.84 pC/mm²) and ferroelectric remnant polarization (~10 µC/cm²) due to the composite structure. The distribution of electrical field in the nanostructure was also analyzed.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 18 June 2007, v. 90, 253107, p. 1-3en_US
dcterms.isPartOfApplied physics lettersen_US
dcterms.issued2007-06-18-
dc.identifier.isiWOS:000247468900080-
dc.identifier.scopus2-s2.0-34547381129-
dc.identifier.eissn1077-3118en_US
dc.identifier.rosgroupidr32142-
dc.description.ros2006-2007 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRA-
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryVoR alloweden_US
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