Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4024
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dc.contributorDepartment of Applied Physics-
dc.contributorDepartment of Mechanical Engineering-
dc.creatorXu, C-
dc.creatorWoo, CH-
dc.creatorShi, SQ-
dc.creatorWang, Y-
dc.date.accessioned2014-12-11T08:22:52Z-
dc.date.available2014-12-11T08:22:52Z-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10397/4024-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in C. H. Xu et al., J. Appl. Phys. 95, 8431 (2004) and may be found at http://link.aip.org/link/?jap/95/8431.en_US
dc.subjectLead compoundsen_US
dc.subjectPiezoelectric materialsen_US
dc.subjectPiezoelectric thin filmsen_US
dc.subjectAtomic force microscopyen_US
dc.subjectSurface morphologyen_US
dc.titleBehavior of a movable electrode in piezo-response mode of an atomic force microscopeen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationAuthor name used in this publication: C. H. Xuen_US
dc.description.otherinformationAuthor name used in this publication: C. H. Wooen_US
dc.description.otherinformationAuthor name used in this publication: S. Q. Shien_US
dc.description.otherinformationAuthor name used in this publication: Y. Wangen_US
dc.identifier.spage8431-
dc.identifier.epage8435-
dc.identifier.volume95-
dc.identifier.issue12-
dc.identifier.doi10.1063/1.1739532-
dcterms.abstractThe objective of this work was to understand the effect of the movable electrode (the tip of an atomic force microscope) on a piezoelectric-induced (PEI) image. Local polarization is induced on a lead zirconate titanate (PZT) thin film using an atomic force microscope (AFM), by applying dc voltage between the movable electrode and the Pt bottom electrode. The polarized PZT film is then characterized by the AFM using a two-pass method, in which both the topography and PEI image are obtained. The surface morphology is recorded in the first pass under contact mode with a fixed setpoint. A PEI image is obtained in the second pass in piezo-response mode. In this mode, the sample surface is scanned by applying ac voltage between the AFM tip and the Pt bottom electrode at sample displacement. PEI images of various sample displacement, corresponding to different stress exerted by the tip on the sample surface, are obtained and analyzed using force–sample displacement curves. It is found that PEI images can be detected if the tip adheres to the sample. The asymmetry of the A cos θ signal is improved as the force changes from repulsive to attractive.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationJournal of applied physics, 15 June 2004, v. 95, no. 12, p. 8431-8435-
dcterms.isPartOfJournal of applied physics-
dcterms.issued2004-06-15-
dc.identifier.isiWOS:000221843400131-
dc.identifier.scopus2-s2.0-3142527101-
dc.identifier.eissn1089-7550-
dc.identifier.rosgroupidr20185-
dc.description.ros2003-2004 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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