Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/27856
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dc.contributorDepartment of Applied Physics-
dc.creatorHuang, W-
dc.creatorWu, ZP-
dc.creatorHao, JH-
dc.date.accessioned2015-06-23T09:07:13Z-
dc.date.available2015-06-23T09:07:13Z-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10397/27856-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2009 American Institute of Physics.en_US
dc.rightsThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in W. Huang, Z. P. Wu and J. H. Hao, Appl. Phys. Lett. 94, 032905 (2009) and may be found at https://dx.doi.org/10.1063/1.3075955en_US
dc.titleElectrical properties of ferroelectric BaTiO3 thin film on SrTiO3 buffered GaAs by laser molecular beam epitaxyen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume94-
dc.identifier.issue3-
dc.identifier.doi10.1063/1.3075955-
dcterms.abstractFerroelectric BaTiO3 thin films were epitaxially grown on (001) GaAs substrate using SrTiO3 as a buffer layer by laser molecular beam epitaxy. The perovskite SrTiO3 buffer layer present a body centered cubic structure by formation of an interfacial layer with the [100] SrTiO 3-
dcterms.abstract[110] GaAs in-plane relationship. Thereupon, a highly c -oriented BaTiO3 thin film was grown on SrTiO3 /GaAs in a layer by layer mode. Enhanced electrical properties of the heteroepitaxial structure were demonstrated. The BaTiO3 (150 nm) / SrTiO3 /GaAs system demonstrates hysteresis loops with a remnant polarization of 2.5 μC/ cm2 at 600 kV/cm and a small leakage current density of 2.9× 10-7 A/ cm2 at 200 kV/cm.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 2009, v. 94, no. 3, 32905, p. 032905-1-032905-3-
dcterms.isPartOfApplied physics letters-
dcterms.issued2009-
dc.identifier.isiWOS:000262724000026-
dc.identifier.scopus2-s2.0-58849100463-
dc.identifier.eissn1077-3118-
dc.identifier.rosgroupidr43254-
dc.description.ros2008-2009 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryVoR alloweden_US
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