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Title: | Interfacial engineering and coupling of electric and magnetic properties in Pb(Zr₀.₅₃Ti₀.₄₇)O₃ /CoFe₂O₄multiferroic epitaxial multilayers | Authors: | Zhang, J Dai, J Chan, HLW |
Issue Date: | 15-May-2010 | Source: | Journal of applied physics, 15 May 2010, v. 107, no. 10, 104105, p. 1-8 | Abstract: | Epitaxial magnetoelectric (ME) Pb(Zr₀.₅₃Ti₀.₄₇)O₃(PZT)/CoFe₂O₄(CFO) multilayer nanocomposite thin films with up to 11 alternative layers are grown on Nb doped SrTiO₃(STO) substrates by pulsed-laser deposition. X-ray diffraction and high resolution transmission electron microscopy studies reveal a good epitaxial relationship between the PZT and CFO layers without interfacial reaction at their interfaces. These epitaxial composite films exhibit strong ferroelectric and magnetic responses simultaneously at room temperature, and the interfacial-coupling-modulated dielectric behavior, polarization, and magnetic properties are observed and analyzed systematically. These results suggest that the magnetic, electric, and ME coupling effect may be tuned by the “strain engineering” in ferroelectric/magnetic or other multiferroic superlattice. | Keywords: | Cobalt compounds Dielectric polarisation Epitaxial growth Epitaxial layers Ferroelectric materials Internal stresses Lead compounds Magnetic multilayers Magnetoelectric effects Multiferroics Nanocomposites Niobium Pulsed laser deposition Strontium compounds Superlattices Transmission electron microscopy X-ray diffraction |
Publisher: | American Institute of Physics | Journal: | Journal of applied physics | ISSN: | 0021-8979 | EISSN: | 1089-7550 | DOI: | 10.1063/1.3386510 | Rights: | © 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in J.X. Zhang, J.Y. Dai & H.L.W. Chan. J. Appl. Phys. 107, 104105 (2010) and may be found at http://link.aip.org/link/?jap/107/104105 |
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