Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/120220
Title: Credible uncertainty quantification under noise and system model mismatch
Authors: Yan, P 
Zhan, X
Sun, R
Hsu, LT 
Issue Date: 2026
Source: IEEE transactions on instrumentation and measurement, 2026, v. 75, 8506712
Abstract: State estimators often provide self-assessed uncertainty metrics, such as covariance matrices, whose credibility is critical for downstream tasks. However, these self-assessments can be misleading due to underlying modeling violations such as noise model mismatch (NMM) or system model misspecification (SMM). This work addresses this problem by developing a unified, multimetric framework that integrates noncredibility index (NCI), negative log-likelihood (NLL), and energy score (ES) metrics, featuring an empirical location test (ELT) to detect system model bias and a directional probing technique that uses the metrics’ asymmetric sensitivities to distinguish NMM from SMM. Monte Carlo simulations reveal that the proposed method achieves excellent diagnosis accuracy (80%–100%) and significantly outperforms single-metric diagnosis methods. In addition, the parameter sensitivity and the scalability against the state dimension are analyzed using the same simulated dataset. The effectiveness of the proposed method is further validated on a real-world ultrawideband (UWB) positioning dataset. Finally, the computational complexity of the proposed framework is discussed, providing insights for practical implementation. This framework provides a useful tool for turning patterns of credibility indicators into actionable diagnoses of model deficiencies.
Keywords: Calibration
Credibility
Noise model mismatch (NMM)
State estimation
System model misspecification (SMM)
Publisher: Institute of Electrical and Electronics Engineers
Journal: IEEE transactions on instrumentation and measurement 
ISSN: 0018-9456
EISSN: 1557-9662
DOI: 10.1109/TIM.2026.3682809
Rights: © 2026 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
The following publication P. Yan, X. Zhan, R. Sun and L. -T. Hsu, "Credible Uncertainty Quantification Under Noise and System Model Mismatch," in IEEE Transactions on Instrumentation and Measurement, vol. 75, pp. 1-12, 2026, Art no. 8506712 is available at https://doi.org/10.1109/TIM.2026.3682809.
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