Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/118437
| DC Field | Value | Language |
|---|---|---|
| dc.contributor | Department of Industrial and Systems Engineering | - |
| dc.creator | Yuan, S | - |
| dc.creator | Cheung, CF | - |
| dc.creator | Fang, F | - |
| dc.creator | Huang, H | - |
| dc.creator | Wang, C | - |
| dc.date.accessioned | 2026-04-15T02:04:56Z | - |
| dc.date.available | 2026-04-15T02:04:56Z | - |
| dc.identifier.issn | 2631-8644 | - |
| dc.identifier.uri | http://hdl.handle.net/10397/118437 | - |
| dc.language.iso | en | en_US |
| dc.publisher | Institute of Physics Publishing Ltd. | en_US |
| dc.rights | Original content from this work may be used under the terms of the Creative Commons Attribution 4.0 license (https://creativecommons.org/licenses/by/4.0/). Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. | en_US |
| dc.rights | ©2026 The Author(s). Published by IOP Publishing Ltd on behalf of the IMMT | en_US |
| dc.rights | The following publication Yuan, S., Cheung, C. F., Fang, F., Huang, H., & Wang, C. (2026). Multi-physical field coupling polishing of diamond for atomic-scale damage-free surface. International Journal of Extreme Manufacturing, 8(3), 032004 is available at https://doi.org/10.1088/2631-7990/ae34fb. | en_US |
| dc.subject | Atomic and close-to-atomic scale manufacturing (ACSM) | en_US |
| dc.subject | Damage-free surface | en_US |
| dc.subject | Diamond | en_US |
| dc.subject | Multi-physical field | en_US |
| dc.subject | Polishing | en_US |
| dc.subject | Ultra-precision machining | en_US |
| dc.title | Multi-physical field coupling polishing of diamond for atomic-scale damage-free surface | en_US |
| dc.type | Journal/Magazine Article | en_US |
| dc.identifier.volume | 8 | - |
| dc.identifier.issue | 3 | - |
| dc.identifier.doi | 10.1088/2631-7990/ae34fb | - |
| dcterms.abstract | Diamond is renowned for its high stability in extreme environments, such as high temperatures, high pressures, and strong corrosive conditions, which makes it demonstrate irreplaceable superior performance in quantum devices, high-power optical systems, and ultra-high-frequency electronic devices. Nevertheless, its intrinsic brittleness, difficulty in material removal, and vulnerability to damage caused by processing severely limit its practical application. The inherently rough surface of as-grown diamond necessitates precision polishing to obtain ultra-smooth, damage-free surface with nanometer-scale roughness, sub-micrometer form accuracy, and minimal subsurface damage. This paper provides a systematic review of state-of-the-art diamond polishing technologies, addressing the challenge of achieving sub-nanometer roughness and damage-free surface, with particular emphasis on the need for atomic-level surface integrity. The discussion covers laser polishing (LP), mechanical polishing (MP), ion beam polishing (IBP), gas cluster ion beam polishing (GCIBP), plasma polishing, dynamic friction polishing (DFP), chemical mechanical polishing (CMP), ultraviolet-assisted polishing (UVAP), plasma-assisted polishing (PAP), laser-assisted polishing (LAP), ultrasonic-assisted polishing (UAP), and other major techniques. By deconstructing these technological approaches, four fundamental material removal mechanisms, i.e., microfracture, graphitization, oxidation, physical sputtering and chemical etching, are identified. This highlights that hybrid, multi-physics polishing strategies can effectively balance the material removal rate (up to several μm·h−1) and surface quality (down to sub-nanometer scale), outperforming conventional single-field techniques. Finally, the review outlines future directions, emphasizing innovations in multi-physics coupling mechanisms and intelligent control of atomic-scale manufacturing processes, thereby providing theoretical guidance and technical pathways to overcome the coupled challenges of atomic precision, efficiency, and extreme service conditions. | - |
| dcterms.accessRights | open access | en_US |
| dcterms.bibliographicCitation | International journal of extreme manufacturing, June 2026, v. 8, no. 3, 032004 | - |
| dcterms.isPartOf | International journal of extreme manufacturing | - |
| dcterms.issued | 2026-06 | - |
| dc.identifier.eissn | 2631-7990 | - |
| dc.identifier.artn | 032004 | - |
| dc.description.validate | 202604 bcch | - |
| dc.description.oa | Version of Record | en_US |
| dc.identifier.FolderNumber | OA_TA | en_US |
| dc.description.fundingSource | Others | en_US |
| dc.description.fundingText | The authors would like to express thanks to the National Key R&D Program of China (No. 2023YFE0203800), National Natural Science Foundation of China (No. 52035009), Guangdong Basic and Applied Basic Research Foundation (2025A1515011366), Innovation and Technology Commission (ITC) of the Government of the HKSAR, China (MHP/151/22), and funding from the Research and Innovation Office of The Hong Kong Polytechnic University (1-W29X, 1-BECE). Appreciation extends to Peng Lyu for his efforts in revising the plasma polishing section. | en_US |
| dc.description.pubStatus | Published | en_US |
| dc.description.TA | IOP (2025) | en_US |
| dc.description.oaCategory | TA | en_US |
| Appears in Collections: | Journal/Magazine Article | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Yuan_2026_Int._J._Extrem._Manuf._8_032004.pdf | 9.38 MB | Adobe PDF | View/Open |
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