Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/118437
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dc.contributorDepartment of Industrial and Systems Engineering-
dc.creatorYuan, S-
dc.creatorCheung, CF-
dc.creatorFang, F-
dc.creatorHuang, H-
dc.creatorWang, C-
dc.date.accessioned2026-04-15T02:04:56Z-
dc.date.available2026-04-15T02:04:56Z-
dc.identifier.issn2631-8644-
dc.identifier.urihttp://hdl.handle.net/10397/118437-
dc.language.isoenen_US
dc.publisherInstitute of Physics Publishing Ltd.en_US
dc.rightsOriginal content from this work may be used under the terms of the Creative Commons Attribution 4.0 license (https://creativecommons.org/licenses/by/4.0/). Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.en_US
dc.rights©2026 The Author(s). Published by IOP Publishing Ltd on behalf of the IMMTen_US
dc.rightsThe following publication Yuan, S., Cheung, C. F., Fang, F., Huang, H., & Wang, C. (2026). Multi-physical field coupling polishing of diamond for atomic-scale damage-free surface. International Journal of Extreme Manufacturing, 8(3), 032004 is available at https://doi.org/10.1088/2631-7990/ae34fb.en_US
dc.subjectAtomic and close-to-atomic scale manufacturing (ACSM)en_US
dc.subjectDamage-free surfaceen_US
dc.subjectDiamonden_US
dc.subjectMulti-physical fielden_US
dc.subjectPolishingen_US
dc.subjectUltra-precision machiningen_US
dc.titleMulti-physical field coupling polishing of diamond for atomic-scale damage-free surfaceen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume8-
dc.identifier.issue3-
dc.identifier.doi10.1088/2631-7990/ae34fb-
dcterms.abstractDiamond is renowned for its high stability in extreme environments, such as high temperatures, high pressures, and strong corrosive conditions, which makes it demonstrate irreplaceable superior performance in quantum devices, high-power optical systems, and ultra-high-frequency electronic devices. Nevertheless, its intrinsic brittleness, difficulty in material removal, and vulnerability to damage caused by processing severely limit its practical application. The inherently rough surface of as-grown diamond necessitates precision polishing to obtain ultra-smooth, damage-free surface with nanometer-scale roughness, sub-micrometer form accuracy, and minimal subsurface damage. This paper provides a systematic review of state-of-the-art diamond polishing technologies, addressing the challenge of achieving sub-nanometer roughness and damage-free surface, with particular emphasis on the need for atomic-level surface integrity. The discussion covers laser polishing (LP), mechanical polishing (MP), ion beam polishing (IBP), gas cluster ion beam polishing (GCIBP), plasma polishing, dynamic friction polishing (DFP), chemical mechanical polishing (CMP), ultraviolet-assisted polishing (UVAP), plasma-assisted polishing (PAP), laser-assisted polishing (LAP), ultrasonic-assisted polishing (UAP), and other major techniques. By deconstructing these technological approaches, four fundamental material removal mechanisms, i.e., microfracture, graphitization, oxidation, physical sputtering and chemical etching, are identified. This highlights that hybrid, multi-physics polishing strategies can effectively balance the material removal rate (up to several μm·h−1) and surface quality (down to sub-nanometer scale), outperforming conventional single-field techniques. Finally, the review outlines future directions, emphasizing innovations in multi-physics coupling mechanisms and intelligent control of atomic-scale manufacturing processes, thereby providing theoretical guidance and technical pathways to overcome the coupled challenges of atomic precision, efficiency, and extreme service conditions.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationInternational journal of extreme manufacturing, June 2026, v. 8, no. 3, 032004-
dcterms.isPartOfInternational journal of extreme manufacturing-
dcterms.issued2026-06-
dc.identifier.eissn2631-7990-
dc.identifier.artn032004-
dc.description.validate202604 bcch-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_TAen_US
dc.description.fundingSourceOthersen_US
dc.description.fundingTextThe authors would like to express thanks to the National Key R&D Program of China (No. 2023YFE0203800), National Natural Science Foundation of China (No. 52035009), Guangdong Basic and Applied Basic Research Foundation (2025A1515011366), Innovation and Technology Commission (ITC) of the Government of the HKSAR, China (MHP/151/22), and funding from the Research and Innovation Office of The Hong Kong Polytechnic University (1-W29X, 1-BECE). Appreciation extends to Peng Lyu for his efforts in revising the plasma polishing section.en_US
dc.description.pubStatusPublisheden_US
dc.description.TAIOP (2025)en_US
dc.description.oaCategoryTAen_US
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