Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/118003
| DC Field | Value | Language |
|---|---|---|
| dc.contributor | Department of Applied Biology and Chemical Technology | - |
| dc.contributor | Research Centre for Deep Space Explorations | - |
| dc.contributor | Research Institute for Future Food | - |
| dc.creator | Wei, W | en_US |
| dc.creator | Chua, SL | en_US |
| dc.date.accessioned | 2026-03-12T01:02:42Z | - |
| dc.date.available | 2026-03-12T01:02:42Z | - |
| dc.identifier.uri | http://hdl.handle.net/10397/118003 | - |
| dc.language.iso | en | en_US |
| dc.publisher | American Chemical Society | en_US |
| dc.rights | © 2026 The Authors. Published by American Chemical Society | en_US |
| dc.rights | This article is licensed under CC-BY 4.0 (https://creativecommons.org/licenses/by/4.0/) | en_US |
| dc.rights | The following publication Wei, W., & Chua, S. L. (2026). Rapid Detection of Nanoplastic Contamination in Plastic Labware by Dynamic Light Scattering Highlights Variations in Experimental Precision. ACS Measurement Science Au, 6(1), 126–133 is available at https://doi.org/10.1021/acsmeasuresciau.5c00142. | en_US |
| dc.subject | Dynamic light scattering | en_US |
| dc.subject | Labware | en_US |
| dc.subject | Microplastics | en_US |
| dc.subject | Nanoplastics | en_US |
| dc.subject | Plastics | en_US |
| dc.subject | Pollution | en_US |
| dc.title | Rapid detection of nanoplastic contamination in plastic labware by dynamic light scattering highlights variations in experimental precision | en_US |
| dc.type | Journal/Magazine Article | en_US |
| dc.identifier.spage | 126 | en_US |
| dc.identifier.epage | 133 | en_US |
| dc.identifier.volume | 6 | en_US |
| dc.identifier.issue | 1 | en_US |
| dc.identifier.doi | 10.1021/acsmeasuresciau.5c00142 | en_US |
| dcterms.abstract | Nanoplastics (NPs) are emerging contaminants of environmental concern, raising significant alarms due to their prevalence and potential health risks. Unlike larger microplastics, NPs are challenging to detect due to their nanodimensions and the reliance on labor-intensive methods such as nanoparticle tracking analysis (NTA) or scanning electron microscopy (SEM). This underscores the urgent need for rapid and accessible detection methods. To address these challenges, we employed dynamic light scattering (DLS), a widely used technique for measuring nanoparticle sizes, to rapidly quantify NP concentrations and sizes. Using DLS, we demonstrated the prevalence of NPs originating from laboratory-based plastic consumables such as microcentrifuge tubes, cryovials, and Petri dishes. Notably, routine actions, including pipet-tip scraping against plastic labware during sample handling, can introduce NPs into solutions. Moreover, physical or chemical procedures, especially sonication and liquid nitrogen treatment, further exacerbate the NP release. This interfered with experimental outcomes, including skewing of DNA and iron nanoparticle concentrations. Our material analysis revealed that the NPs were made of polystyrene and polypropylene, which correlated to manufacturers’ product details. Hence, our study highlights an under-recognized NP source that compromises research integrity while contributing to global NP pollution, thus emphasizing the need for sustainable laboratory practices and robust contamination control. | - |
| dcterms.accessRights | open access | en_US |
| dcterms.bibliographicCitation | ACS measurement science Au, 18 Feb. 2026, v. 6, no. 1, p. 126-133 | en_US |
| dcterms.isPartOf | ACS measurement science Au | en_US |
| dcterms.issued | 2026-02-18 | - |
| dc.identifier.scopus | 2-s2.0-105030719691 | - |
| dc.identifier.eissn | 2694-250X | en_US |
| dc.description.validate | 202603 bcch | - |
| dc.description.oa | Version of Record | en_US |
| dc.identifier.FolderNumber | OA_TA | - |
| dc.description.fundingSource | Others | en_US |
| dc.description.fundingText | We would like to thank the Hong Kong Polytechnic University’s University Facility of Life Sciences (ULS) and University Research Facility in Materials Characterization and Device Fabrication (UMF) for their assistance in training and using their equipment. | en_US |
| dc.description.pubStatus | Published | en_US |
| dc.description.TA | ACS (2026) | en_US |
| dc.description.oaCategory | TA | en_US |
| Appears in Collections: | Journal/Magazine Article | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Wei_Rapid_Detection_Nanoplastic.pdf | 2.71 MB | Adobe PDF | View/Open |
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