Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/117553
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dc.contributorDepartment of Applied Physics-
dc.creatorWang, Len_US
dc.creatorXia, Zen_US
dc.creatorSun, Xen_US
dc.creatorXu, Sen_US
dc.creatorSun, Gen_US
dc.creatorZheng, Yen_US
dc.creatorZhan, Zen_US
dc.creatorLi, Een_US
dc.creatorCai, Sen_US
dc.creatorZhang, Yen_US
dc.creatorZhao, Jen_US
dc.creatorLi, Wen_US
dc.creatorYuan, Sen_US
dc.date.accessioned2026-02-26T03:46:50Z-
dc.date.available2026-02-26T03:46:50Z-
dc.identifier.urihttp://hdl.handle.net/10397/117553-
dc.language.isoenen_US
dc.publisherWiley-VCH Verlag GmbH & Co. KGaAen_US
dc.rights© 2025 The Author(s). Advanced Science published by Wiley-VCH GmbH. This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.en_US
dc.rightsThe following publication L. Wang, Z. Xia, X. Sun, et al. “ Ferroelectric Properties of Bilayer MoS2/WS2 Heterostructure Modulated by Twist Angle.” Adv. Sci. 12, no. 48 (2025): e13738 is available at https://doi.org/10.1002/advs.202513738.en_US
dc.subject2D materialsen_US
dc.subjectFerroelectricityen_US
dc.subjectField-effect transistorsen_US
dc.subjectMoS2/WS2 heterostructureen_US
dc.subjectTwist anglesen_US
dc.titleFerroelectric properties of bilayer MoS₂/WS₂ heterostructure modulated by twist angleen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume12en_US
dc.identifier.issue48en_US
dc.identifier.doi10.1002/advs.202513738en_US
dcterms.abstractThe emergence of sliding ferroelectricity is found in non-ferroelectric two-dimensional materials, which brings novel ferroelectric phenomena and expands the potential for advancing ferroelectric devices. Experimental studies have largely focused on sliding ferroelectricity with fixed twist angles owing to the limitations of preparation methods with controlled angles. However, how to modulate the ferroelectric properties in the sliding materials is still challenging. In this work, the out-of-plane ferroelectric properties of typical bilayer MoS2/WS2 heterostructure are reported by precisely controlling twist angles. The experimental results demonstrate that the second-harmonic generation response, indicative of symmetry breaking, decreases as the twist angle increases. In addition, the switching voltage of ferroelectric polarization exhibits the opposite trend with increasing the twist angle. According to experimental studies and theoretical calculations, the tunability of ferroelectric properties arises from the distortion of polar symmetry regions induced by Moiré patterns at different twist angles. Furthermore, the ferroelectric semiconductor field-effect transistors yield the twist angles dependent electrical properties, achieving a large ferroelectric memory window of ≈14 V. The study opens the door to significantly modulating the sliding ferroelectricity via designing twist angles, which will enrich the framework of twistronics and expand the promising applications in the emerging sliding ferroelectric devices.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationAdvanced science, 29 Dec. 2025, v. 12, no. 48, e13738en_US
dcterms.isPartOfAdvanced scienceen_US
dcterms.issued2025-12-29-
dc.identifier.scopus2-s2.0-105018481705-
dc.identifier.pmid41059971-
dc.identifier.eissn2198-3844en_US
dc.identifier.artne13738en_US
dc.description.validate202602 bcch-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_Scopus/WOS-
dc.description.fundingSourceOthersen_US
dc.description.fundingTextL.W. and Z.X. contributed equally to this work. This work was supported by National Natural Science Foundation of China (Nos. 12274145, 62374043), Science and Technology Program of Hubei Province (No. 2025EHA029), Guangdong Basic and Applied Basic Research Foundation (Nos. 2023A1515012792, 2023A1515010672), Guangdong Provincial University Science and Technology Program (No. 2023KTSCX029), New Faculty Startup Fund of China University of Geosciences (No. 162301212607), Shanghai Pilot Program for Basic Research-Fudan University 21TQ1400100 (No. 25TQ001), National Key Laboratory of Integrated Circuit Materials (No. SKLJC-K2025-04), State Key Laboratory of Dynamic Measurement Technology (No. 2024-SYSJJ-06). J.Z. acknowledges the startup funding of South China Normal University.en_US
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryCCen_US
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