Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/117277
DC FieldValueLanguage
dc.contributorDepartment of Industrial and Systems Engineeringen_US
dc.contributorResearch Institute for Advanced Manufacturingen_US
dc.creatorGui, Hen_US
dc.creatorYang, Zen_US
dc.creatorHarish, ARen_US
dc.creatorRen, Cen_US
dc.creatorYang, Yen_US
dc.creatorLi, Men_US
dc.date.accessioned2026-02-09T08:38:13Z-
dc.date.available2026-02-09T08:38:13Z-
dc.identifier.issn0278-6125en_US
dc.identifier.urihttp://hdl.handle.net/10397/117277-
dc.language.isoenen_US
dc.publisherElsevieren_US
dc.subjectCustomized garment manufacturingen_US
dc.subjectDual-graph structure modellingen_US
dc.subjectGraph convolutional networksen_US
dc.subjectHuman robot collaborative manufacturingen_US
dc.subjectMultimodal large language model (MLLM)en_US
dc.titleGenpattern : dual-graph enhanced sewing pattern generation via multimodal large language modelen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationTitle on author’s file: GENPATTERN: DUAL-GRAPH ENHANCEDSEWING PATTERN GENERATION VIA MLLMen_US
dc.identifier.spage822en_US
dc.identifier.epage838en_US
dc.identifier.volume83en_US
dc.identifier.doi10.1016/j.jmsy.2025.11.005en_US
dcterms.abstractCustomized garment production is hindered by the expert-dependent nature of sewing pattern generation—a skill-intensive process requiring years of training. While recent approaches aim to translate user intent into sewing patterns, they often struggle to interpret multimodal inputs such as text and images. Multimodal large language models (MLLMs) offer a promising path forward, as they can naturally understand diverse user intents. Yet, applying MLLMs to sewing pattern generation is challenging because conventional tokenization methods often lose the structural information of sewing patterns. To address this issue, we propose GenPattern, a novel framework that integrates structured graph modeling with MLLMs to enable more accurate sewing pattern generation. We introduce a scalable vector graphics (SVG)-style pattern tokenizer, which encodes sewing patterns into structured token sequences. Furthermore, we present SewGraphFuser, a dual-graph module that explicitly models geometric and semantic dependencies to inject structural information into MLLMs. This module combines a structure graph convolution module and a sequence graph convolution module to jointly capture multi-scale spatial and sequential features via a geometric consistency graph and a semantic dependency graph. Finally, to bridge the gap between digital design and physical fabrication, our framework drives a human-robot collaborative cutting platform, enabling expert-free, on-demand garment customization. This innovation empowers human-robot collaboration in pattern production, enhancing scalability in real-world manufacturing. Experimental results show that GenPattern achieves 86.7 % stitch accuracy and reduces panel vertex L2 error to 2.9 cm, demonstrating its potential to democratize custom fashion by enabling non-experts to reliably produce physical garments directly from their ideas.en_US
dcterms.accessRightsembargoed accessen_US
dcterms.bibliographicCitationJournal of manufacturing systems, Dec. 2025, v. 83, p. 822-838en_US
dcterms.isPartOfJournal of manufacturing systemsen_US
dcterms.issued2025-12-
dc.identifier.scopus2-s2.0-105021475511-
dc.description.validate202602 bchyen_US
dc.description.oaNot applicableen_US
dc.identifier.SubFormIDG000858/2026-01-
dc.description.fundingSourceRGCen_US
dc.description.fundingSourceOthersen_US
dc.description.fundingTextThis research is partially supported by two grants from the Research Grants Council of the Hong Kong Special Administrative Region, China (Project No. T32-707/22-N and C7076-22G ), and the Innovation and Technology Fund (Project No. ITP/046/25TI ).en_US
dc.description.pubStatusPublisheden_US
dc.date.embargo2027-12-31en_US
dc.description.oaCategoryGreen (AAM)en_US
Appears in Collections:Journal/Magazine Article
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Embargo End Date 2027-12-31
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