Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/117084
Title: Graph embedding-based Bayesian network for fault isolation in complex equipment
Authors: Xia, L 
Zheng, P 
Herrera, M
Liang, Y 
Li, X
Gao, L
Issue Date: Sep-2025
Source: IEEE transactions on reliability, Sept 2025, v. 74, no. 3, p. 3897-3910
Abstract: Fault isolation, or fault location, aims to identify anomalous components at the start of the maintenance process. However, fault isolation within complex equipment can be challenging due to constraints on the scarcity of labeled data and the intricate interaction among various substructures. To overcome this challenge, an embedding-based Bayesian Network (BN) probability inference is proposed to locate the fault components, where the embedding, derived from semantic meanings, can approximate the actual fault distribution within BN. First, a Fault Graph (FG) is established based on the equipment's mechanical structure and its mechanisms. Then, a Multifield hyperbolic embedding is employed to vectorize the nodes in the FG, thereby preserving the inherent logic maximally. Following this, the FG is transformed into the BN, which facilitates the prediction of the faulty component based on available evidence, using the well-trained graph embedding. An empirical study on oil drilling equipment showcases the graph embedding properties and inference performance of the proposed method by comparing it with other cutting-edge methods and traditional scenarios.
Keywords: Bayesian network (BN)
Cognitive predictive maintenance
Fault isolation
Knowledge graph
Reliability analysis
Publisher: Institute of Electrical and Electronics Engineers
Journal: IEEE transactions on reliability 
ISSN: 0018-9529
EISSN: 1558-1721
DOI: 10.1109/TR.2024.3416064
Rights: © 2024 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
The following publication L. Xia, P. Zheng, M. Herrera, Y. Liang, X. Li and L. Gao, 'Graph Embedding-Based Bayesian Network for Fault Isolation in Complex Equipment,' in IEEE Transactions on Reliability, vol. 74, no. 3, pp. 3897-3910, Sept. 2025 is available at https://doi.org/10.1109/TR.2024.3416064.
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