Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/115903
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dc.contributorDepartment of Industrial and Systems Engineeringen_US
dc.creatorKhan, WAen_US
dc.creatorChung, SHen_US
dc.creatorLiu, SQen_US
dc.creatorMasoud, Men_US
dc.creatorWen, Xen_US
dc.date.accessioned2025-11-13T04:28:57Z-
dc.date.available2025-11-13T04:28:57Z-
dc.identifier.issn2168-2216en_US
dc.identifier.urihttp://hdl.handle.net/10397/115903-
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.rights© 2025 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en_US
dc.rightsThe following publication W. Ahmed Khan, S. -H. Chung, S. Qiang Liu, M. Masoud and X. Wen, 'Smoothing and Matrix Decomposition-Based Stacked Bidirectional GRU Model for Machine Downtime Forecasting,' in IEEE Transactions on Systems, Man, and Cybernetics: Systems, 55(10), 7215-7227 is available at https://doi.org/10.1109/TSMC.2025.3582768.en_US
dc.subjectDeep learning (DL)en_US
dc.subjectGated recurrent unit (GRU)en_US
dc.subjectMachine downtimeen_US
dc.subjectMatrix decomposition (MD)en_US
dc.subjectSmoothingen_US
dc.titleSmoothing and matrix decomposition-based stacked bidirectional GRU model for machine downtime forecastingen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage7215en_US
dc.identifier.epage7227en_US
dc.identifier.volume55en_US
dc.identifier.issue10en_US
dc.identifier.doi10.1109/TSMC.2025.3582768en_US
dcterms.abstractThe machine downtime occurring during routine production (MDT_RP) because of recessive disturbances (RecDs) can cause huge economic losses and slow down production. In modern industries, condition monitoring, prognosis, and maintenance policies are widely applied to minimize machine failures caused by dominant disturbances (DomDs). However, MDT_RP, because of RecD, has rarely been explored. RecD multivariate time series data faces the challenge of changing information with many noisy and abnormal data points, making it difficult for sequential methods (SMs) to forecast MDT_RP accurately. To address this gap, a novel smoothing and matrix decomposition (MD) based stacked bidirectional gated recurrent unit (STMD_SBiGRU) is proposed for MDT_RP forecasting. Existing SMs have disadvantages in that they are highly affected by noisy data, which significantly affects their feature information extraction capability. The generated error gets amplified during forward propagation, thus interfering with the parameter’s optimization. The proposed STMD_SBiGRU has the advantage of capturing the maximum variance in the dataset by using various MD methods, as well as reducing abnormalities by applying various smoothing factors. This dual innovation of integrating MD and smoothing facilitates the effective distribution of parameters across multiple stacked layers and directions in a proposed model, thus avoiding complexity and overfitting problems of conventional SMs while improving network generalization performance. The extensive experimental work demonstrates that STMD_SBiGRU can forecast MDT_RP with better performance and is highly robust to noisy data compared to other data-driven methods.en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationIEEE transactions on systems, man, and cybernetics. Systems, Oct. 2025, v. 55, no. 10, p. 7215-7227en_US
dcterms.isPartOfIEEE transactions on systems, man, and cybernetics. Systemsen_US
dcterms.issued2025-10-
dc.identifier.scopus2-s2.0-105010873471-
dc.identifier.eissn2168-2232en_US
dc.description.validate202511 bchyen_US
dc.description.oaAccepted Manuscripten_US
dc.identifier.SubFormIDG000353/2025-08-
dc.description.fundingSourceSelf-fundeden_US
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryGreen (AAM)en_US
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