Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/115642
PIRA download icon_1.1View/Download Full Text
DC FieldValueLanguage
dc.contributorDepartment of Electrical and Electronic Engineering-
dc.contributorResearch Institute for Smart Energy-
dc.contributorPhotonic Research Institute-
dc.creatorHao, Jen_US
dc.creatorFeng, Yen_US
dc.creatorMa, Qen_US
dc.creatorLi, Hen_US
dc.creatorHong, Cen_US
dc.creatorHou, Cen_US
dc.creatorWang, Yen_US
dc.creatorJing, Yen_US
dc.creatorLi, Yen_US
dc.creatorLiu, Gen_US
dc.creatorLi, Xen_US
dc.creatorLi, Aen_US
dc.creatorBian, Fen_US
dc.creatorMa, Ren_US
dc.creatorWang, Yen_US
dc.creatorHuang, Yen_US
dc.creatorYang, Cen_US
dc.date.accessioned2025-10-10T00:19:47Z-
dc.date.available2025-10-10T00:19:47Z-
dc.identifier.urihttp://hdl.handle.net/10397/115642-
dc.language.isoenen_US
dc.publisherWiley-VCH Verlag GmbH & Co. KGaAen_US
dc.rights© 2025 The Author(s). Advanced Science published by Wiley-VCH GmbH. This is an open access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/), which permits use, distribution and reproduction in any medium, provided the original work is properly cited.en_US
dc.rightsThe following publication J. Hao, Y. Feng, Q. Ma, et al. “ Real-Time Probing of Morphological Evolution and Recrystallization During Solvent Annealing in Blade-Coated All-Polymer Organic Solar Cells Using In Situ X-Ray Scattering.” Adv. Sci. 12, no. 35 (2025): 12, e01823 is available at https://doi.org/10.1002/advs.202501823.en_US
dc.subjectAll-polymer solar cellsen_US
dc.subjectBlade-coatingen_US
dc.subjectGIWAXSen_US
dc.subjectIn situen_US
dc.subjectSolvent vapor annealingen_US
dc.titleReal-time probing of morphological evolution and recrystallization during solvent annealing in blade-coated all-polymer organic solar cells using in situ X-ray scatteringen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume12en_US
dc.identifier.issue35en_US
dc.identifier.doi10.1002/advs.202501823en_US
dcterms.abstractOptimizing the morphology of the active layer is crucial for achieving high photovoltaic conversion efficiency in all-polymer solar cells (APSCs). Solvent vapor annealing (SVA) is an essential post-treatment strategy for controlling active layer morphology. However, most current SVA are conducted ex situ, limiting their ability to accurately reveal the morphological evolution of active layers of APSCs. In this study, in situ synchrotron radiation GIWAXS and in situ UV–vis spectroscopy combined with GISAXS is used to monitor the morphological evolution of PM6/PY-IT blends during the SVA process in real-time. Results showed that the PY-IT absorption peak exhibited a red shift under a nonpolar carbon disulfide vapor, while a blue shift is observed during the SVA process with a polar chloroform vapor. The SVA process can be divided into three stages: solvent swelling, recrystallization, and molecular rearrangement. For thermally pre-annealed samples subjected to chloroform SVA, the power conversion efficiency (PCE) increased by 15.1%. The improved PCE stems from reduced crystal plane spacing (d-spacing), enhanced crystal coherence length, and optimal phase separation via SVA. Pre-annealing suppresses excessive swelling, emphasizing the reordering dynamical role in the morphology of APSCs. This study offers insights into balancing SVA conditions to maximize performance and minimize adverse effects.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationAdvanced science, 18 Sept 2025, v. 12, no. 35, e01823en_US
dcterms.isPartOfAdvanced scienceen_US
dcterms.issued2025-09-18-
dc.identifier.scopus2-s2.0-105008753764-
dc.identifier.eissn2198-3844en_US
dc.identifier.artne01823en_US
dc.description.validate202510 bcch-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_TA-
dc.description.fundingSourceOthersen_US
dc.description.fundingTextJ.H., Y.F., Q.M., and H.L. contributed equally to this work. The authors gratefully acknowledge financial support from the National Key R&D Program of China (Grants No. 2021YFA1601000), the National Natural Science Foundation of China (Grants No. 12175295, U1932118), the Shanghai Municipal Science and Technology Major Project, and the Strategic Priority Research Program of the Chinese Academy of Sciences (Grant No. XDB0470202). X-ray scattering data were collected at beamlines BL16B1 and BL10U1 of the Shanghai Synchrotron Radiation Facility (SSRF). The authors thank the SSRF Experiment Assist System (https://cstr.cn/31124.02.SSRF.LAB) for assistance with TEM and AFM measurements. They also sincerely appreciate the support and discussions provided by the beamline scientists at SSRF beamlines BL19U2, BL17U, and BL18B.en_US
dc.description.pubStatusPublisheden_US
dc.description.TAWiley (2025)en_US
dc.description.oaCategoryTAen_US
Appears in Collections:Journal/Magazine Article
Files in This Item:
File Description SizeFormat 
Hao_Real_Time_Probing.pdf3.84 MBAdobe PDFView/Open
Open Access Information
Status open access
File Version Version of Record
Access
View full-text via PolyU eLinks SFX Query
Show simple item record

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.