Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/115533
DC FieldValueLanguage
dc.contributorDepartment of Electrical and Electronic Engineering-
dc.creatorXiao, Z-
dc.creatorPeng, D-
dc.creatorWang, Z-
dc.creatorDong, TX-
dc.creatorShao, Y-
dc.date.accessioned2025-10-06T02:52:58Z-
dc.date.available2025-10-06T02:52:58Z-
dc.identifier.issn1474-0346-
dc.identifier.urihttp://hdl.handle.net/10397/115533-
dc.language.isoenen_US
dc.publisherElsevier Ltden_US
dc.subjectDeep learningen_US
dc.subjectPart quality detectionen_US
dc.subjectTwo-photon lithographyen_US
dc.subjectVideo transformeren_US
dc.titleVideo transformer with three-dimensional shifted window multi-head self-attention for automatic part quality detection during two-photon lithographyen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume67-
dc.identifier.doi10.1016/j.aei.2025.103585-
dcterms.abstractTwo-photon lithography (TPL) is an advanced technique used for additive manufacturing. How to effectively inspect the part quality is one of the challenges of TPL before large-scale industrial application. To produce cured part, the light dosage parameter is limited during the fabrication process, and the limit varies from different application scenarios. By automatic recognition of part quality, engineers can efficiently find light dosage limits and monitor the fabrication process. This paper introduces a visual monitoring-based video Transformer with three-dimensional (3D) shifted window multi-head self-attention for automatically detecting part quality in four typical real scenarios. This framework introduces a multi-head self-attention mechanism to capture global features, thereby integrating spatial and sequential information for part quality recognition. The 3D shifted window mechanism is also applied to introduce the locality similar to convolution and reduce computational complexity. In addition, hierarchical representation is introduced to Transformer architecture, which helps to model high-level information from low-level features. The dataset with four scenarios, which are different in write pattern and photoresist, is used to evaluate the feasibility of the industrialization of this framework. The results show that the proposed method has better performance than the traditional deep learning model in the detection of part quality.-
dcterms.accessRightsembargoed accessen_US
dcterms.bibliographicCitationAdvanced engineering informatics, Sept 2025, v. 67, 103585-
dcterms.isPartOfAdvanced engineering informatics-
dcterms.issued2025-09-
dc.identifier.scopus2-s2.0-105008894367-
dc.identifier.eissn1873-5320-
dc.identifier.artn103585-
dc.description.validate202510 bcch-
dc.description.oaNot applicableen_US
dc.identifier.SubFormIDG000203/2025-07en_US
dc.description.fundingSourceSelf-fundeden_US
dc.description.pubStatusPublisheden_US
dc.date.embargo2027-09-30en_US
dc.description.oaCategoryGreen (AAM)en_US
Appears in Collections:Journal/Magazine Article
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Embargo End Date 2027-09-30
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