Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/114830
| DC Field | Value | Language |
|---|---|---|
| dc.contributor | Department of Industrial and Systems Engineering | - |
| dc.creator | Yuan, S | - |
| dc.creator | Cheung, CF | - |
| dc.creator | Shokrani, A | - |
| dc.creator | Zhan, Z | - |
| dc.creator | Wang, C | - |
| dc.date.accessioned | 2025-09-01T01:52:41Z | - |
| dc.date.available | 2025-09-01T01:52:41Z | - |
| dc.identifier.issn | 0007-8506 | - |
| dc.identifier.uri | http://hdl.handle.net/10397/114830 | - |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier BV | en_US |
| dc.rights | © 2025 The Authors. Published by Elsevier Ltd on behalf of CIRP. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/) | en_US |
| dc.rights | The following publication Yuan, S., Cheung, C. F., Shokrani, A., Zhan, Z., & Wang, C. (2025). Atomic-level flat polishing of polycrystalline diamond by combining plasma modification and chemical mechanical polishing. CIRP Annals, 74(1), 441–445 is available at https://doi.org/10.1016/j.cirp.2025.03.024. | en_US |
| dc.subject | Diamond | en_US |
| dc.subject | Plasma | en_US |
| dc.subject | Polishing | en_US |
| dc.title | Atomic-level flat polishing of polycrystalline diamond by combining plasma modification and chemical mechanical polishing | en_US |
| dc.type | Journal/Magazine Article | en_US |
| dc.identifier.spage | 441 | - |
| dc.identifier.epage | 445 | - |
| dc.identifier.volume | 74 | - |
| dc.identifier.issue | 1 | - |
| dc.identifier.doi | 10.1016/j.cirp.2025.03.024 | - |
| dcterms.abstract | This paper presents an atomic-level flat polishing method based on hydroxyl (•OH) oxidation combining plasma modification and chemical mechanical polishing (CMP) of polycrystalline diamond (PCD). The PCD surface was firstly modified using •OH generated by He-based H2O2 plasma leading to the formation of an approximately 30 nm thick uniform oxidation layer on the PCD surface composed of carbon-oxygen mixed layer and oxygen-rich layer. Reactive force field molecular dynamics (ReaxFF MD) simulations explained the plasma modification mechanism. The modified layer was then removed using CMP resulting in an atomic-level flat surface with arithmetical mean height (Sa) of 0.366 nm. | - |
| dcterms.accessRights | open access | en_US |
| dcterms.bibliographicCitation | CIRP annals : manufactering technology, 2025, v. 74, no. 1, p. 441-445 | - |
| dcterms.isPartOf | CIRP annals : manufactering technology | - |
| dcterms.issued | 2025 | - |
| dc.identifier.scopus | 2-s2.0-105003232885 | - |
| dc.identifier.eissn | 1726-0604 | - |
| dc.description.validate | 202509 bcch | - |
| dc.description.oa | Version of Record | en_US |
| dc.identifier.FolderNumber | OA_TA | en_US |
| dc.description.fundingSource | Others | en_US |
| dc.description.fundingText | The authors would like to express thanks to the National Key R&D Program of China (No. 2023YFE0203800), Innovation and Technology Commission (ITC) of the Government of the HKSAR, China (MHP/151/ 22), Guangdong Basic and Applied Basic Research Foundation (2025A1515011366), and Postdoc Matching Fund Scheme of The Hong Kong Polytechnic University (1-W29X). The authors acknowledge the Beijing Super Cloud Computing Center (BSCC) for providing HPC resources that have contributed to the research results reported within this paper. The authors also thank Prof. Hui Deng from Southern University of Science and Technology for his strong support to this paper. | en_US |
| dc.description.pubStatus | Published | en_US |
| dc.description.TA | Elsevier (2025) | en_US |
| dc.description.oaCategory | TA | en_US |
| Appears in Collections: | Journal/Magazine Article | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 1-s2.0-S0007850625000241-main.pdf | 2.48 MB | Adobe PDF | View/Open |
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