Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/114635
PIRA download icon_1.1View/Download Full Text
DC FieldValueLanguage
dc.contributorDepartment of Electrical and Electronic Engineering-
dc.creatorSomekh, MG-
dc.creatorPechprasarn, S-
dc.creatorChow, WK-
dc.creatorMeng, J-
dc.creatorShen, H-
dc.date.accessioned2025-08-18T03:02:27Z-
dc.date.available2025-08-18T03:02:27Z-
dc.identifier.issn0277-786X-
dc.identifier.urihttp://hdl.handle.net/10397/114635-
dc.descriptionSPIE BIOS, 13-18 February 2016, San Francisco, California, United Statesen_US
dc.language.isoenen_US
dc.publisherSPIE - International Society for Optical Engineeringen_US
dc.rightsCopyright 2016 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited.en_US
dc.rightsThe following publication Michael G. Somekh, Suejit Pechprasarn, Wai-Kin Chow, Jingkai Meng, and Hong Shen "New avenues for confocal surface plasmon microscopy", Proc. SPIE 9724, Plasmonics in Biology and Medicine XIII, 972409 (22 April 2016) is available at https://doi.org/10.1117/12.2223223.en_US
dc.titleNew avenues for confocal surface plasmon microscopyen_US
dc.typeConference Paperen_US
dc.identifier.volume9724-
dc.identifier.doi10.1117/12.2223223-
dcterms.abstractThe principal strength of the confocal microscope for biological imaging lies its ability to detect only light that emerges at close to the focal plane, eliminating light originating from different focal planes. We discuss how this confocal property has considerable advantage in the detection of surface plasmons, since it defines the path of the detected radiation, thus greatly improving the lateral resolution and also the measurement precision. In this paper we show how a spatial light modulator in the back focal plane allows one to generate a whole range of new imaging properties that confer great flexibility on the system. The technique allows one to measure surface wave velocity, surface wave attenuation and perform rapid single shot measurement and effect common path operation.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationProceedings of SPIE : the International Society for Optical Engineering, 2016, v. 9724, 972409-
dcterms.isPartOfProceedings of SPIE : the International Society for Optical Engineering-
dcterms.issued2016-
dc.identifier.scopus2-s2.0-84982124769-
dc.identifier.eissn1996-756X-
dc.identifier.artn972409-
dc.description.validate202508 bcch-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_Othersen_US
dc.description.fundingSourceSelf-fundeden_US
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryVoR alloweden_US
Appears in Collections:Conference Paper
Files in This Item:
File Description SizeFormat 
972409.pdf476.04 kBAdobe PDFView/Open
Open Access Information
Status open access
File Version Version of Record
Access
View full-text via PolyU eLinks SFX Query
Show simple item record

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.