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Title: PSO-based optimal coverage path planning for surface defect inspection of 3C components with a robotic line scanner
Authors: Chen, H 
Huo, S 
Muddassir, M 
Lee, HY 
Liu, Y
Li, J 
Duan, A
Zheng, P 
NavarroAlarcon, D 
Issue Date: 2025
Source: IEEE transactions on instrumentation and measurement, 2025, v. 74, 7505012
Abstract: The automatic inspection of surface defects is an essential task for quality control in the computers, communications, and consumer (3C) electronics industry. Traditional inspection mechanisms (i.e., line-scan sensors) have a limited field of view (FOV), thus prompting the necessity for a multifaceted robotic inspection system capable of comprehensive scanning. Optimally selecting the robot's viewpoints and planning a path is regarded as coverage path planning (CPP), a problem that enables inspecting the object's complete surface while reducing the scanning time and avoiding misdetection of defects. In this article, we present a new approach for robotic line scanners to detect surface defects of 3C free-form objects automatically. A two-stage region segmentation method defines the local scanning based on the random sample consensus (RANSAC) and K-means clustering to improve the inspection coverage. The proposed method also consists of an adaptive region-of-interest (ROI) algorithm to define the local scanning paths. Besides, a particle swarm optimization (PSO)-based method is used for global inspection path generation to minimize the inspection time. The developed method is validated by simulation-based and experimental studies on various free-form workpieces, and its performance is compared with that of two state-of-the-art solutions. The reported results demonstrate the feasibility and effectiveness of our proposed method.
Keywords: And consumer (3C) components
Communications
Computers
Coverage path planning (CPP)
Line-scan sensor
Robotic inspection
Surface inspection
Publisher: Institute of Electrical and Electronics Engineers
Journal: IEEE transactions on instrumentation and measurement 
ISSN: 0018-9456
EISSN: 1557-9662
DOI: 10.1109/TIM.2025.3552466
Rights: © 2025 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
The following publication H. Chen et al., "PSO-Based Optimal Coverage Path Planning for Surface Defect Inspection of 3C Components With a Robotic Line Scanner," in IEEE Transactions on Instrumentation and Measurement, vol. 74, pp. 1-12, 2025, Art no. 7505012 is available at https://doi.org/10.1109/TIM.2025.3552466.
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