Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/111227
PIRA download icon_1.1View/Download Full Text
DC FieldValueLanguage
dc.contributorDepartment of Applied Physicsen_US
dc.creatorHerng, TSen_US
dc.creatorLau, SPen_US
dc.creatorYu, SFen_US
dc.creatorTsang, SHen_US
dc.creatorTeng, KSen_US
dc.creatorChen, JSen_US
dc.date.accessioned2025-02-17T01:38:08Z-
dc.date.available2025-02-17T01:38:08Z-
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/10397/111227-
dc.language.isoenen_US
dc.publisherAIP Publishing LLCen_US
dc.rights© 2008 American Institute of Physicsen_US
dc.rightsThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in T. S. Herng, S. P. Lau, S. F. Yu, S. H. Tsang, K. S. Teng, J. S. Chen; Ferromagnetic Cu doped ZnO as an electron injector in heterojunction light emitting diodes. J. Appl. Phys. 15 November 2008; 104 (10): 103104 and may be found at https://doi.org/10.1063/1.3021142.en_US
dc.titleFerromagnetic Cu doped ZnO as an electron injector in heterojunction light emitting diodesen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage103104-1en_US
dc.identifier.epage103104-6en_US
dc.identifier.volume104en_US
dc.identifier.issue10en_US
dc.identifier.doi10.1063/1.3021142en_US
dcterms.abstractFerromagnetic and highly conductive copper doped ZnO (ZnO:Cu) films were prepared by filtered cathodic vacuum arc technique. By employing a biasing technique during growth, the electron concentration and resistivity of the ZnO:Cu films can be as high as 1020 cm-3 and 5.2× 10-3 cm, respectively. The ferromagnetic behavior is observed in all the conductive films, but its magnetization is quenched with an increment in carrier concentration, suggesting that carrier induced exchange is not directly responsible for the ferromagnetism. Heterojunction light emitting diodes have been fabricated using the conductive ZnO:Cu layer as an electron injector and a p -type GaN as hole injector. Electroluminescence can be detected from the devices.en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationJournal of applied physics, 15 Nov. 2008, v. 104, no. 10, 103104, p. 103104-1 - 103104-6en_US
dcterms.isPartOfJournal of applied physicsen_US
dcterms.issued2008-11-15-
dc.identifier.scopus2-s2.0-57149104196-
dc.identifier.eissn1089-7550en_US
dc.identifier.artn103104en_US
dc.description.validate202502 bcchen_US
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_Others-
dc.description.fundingSourceOthersen_US
dc.description.fundingTextRoyal Society of the United Kingdom; Ministry of Education (Singapore)en_US
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryVoR alloweden_US
Appears in Collections:Journal/Magazine Article
Files in This Item:
File Description SizeFormat 
103104_1_online.pdf1.05 MBAdobe PDFView/Open
Open Access Information
Status open access
File Version Version of Record
Access
View full-text via PolyU eLinks SFX Query
Show simple item record

Page views

36
Citations as of Aug 13, 2025

Downloads

72
Citations as of Aug 13, 2025

SCOPUSTM   
Citations

38
Citations as of Dec 19, 2025

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.