Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/107407
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Title: Engineering of a charged incoherent BiFeO₃/SrTiO₃ interface
Authors: Ji, D 
Zhang, Y
Mao, W
Gu, M
Xiao, Y 
Yang, Y 
Guo, W
Gu, Z
Zhou, J
Wang, P
Nie, Y
Pan, X
Issue Date: May-2024
Source: APL materials, May 2024, v. 12, no. 5, 051103
Abstract: Atomic-level control of complex oxide heterostructure interfaces has resulted in unprecedented properties and functionalities. The majority of oxide heterointerfaces being intensively investigated maintain lattice coherence and exhibit a flawless epitaxial alignment between the films and the substrates. Here, we report the engineering of a charged incoherent BiFeO3/SrTiO3 interface using a tailored deposition sequence in reactive oxide molecular beam epitaxy. By introducing an additional iron oxide layer to disrupt the lattice coherence at the interface, the overlying BiFeO3 is stabilized in a tetragonal phase with its enhanced ferroelectric polarization pointing toward the SrTiO3 substrate, which drives free electrons to accumulate at the incoherent interface. Our findings reveal how controlling lattice coherence at oxide heterointerfaces can open new avenues for fabricating artificial oxide heterostructures with unique properties through precise interface engineering.
Publisher: AIP Publishing LLC
Journal: APL materials 
EISSN: 2166-532X
DOI: 10.1063/5.0203518
Rights: © 2024 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
The following publication Dianxiang Ji, Yi Zhang, Wei Mao, Min Gu, Yiping Xiao, Yang Yang, Wei Guo, Zhengbin Gu, Jian Zhou, Peng Wang, Yuefeng Nie, Xiaoqing Pan; Engineering of a charged incoherent BiFeO3/SrTiO3 interface. APL Mater. 1 May 2024; 12 (5): 051103 is available at https://doi.org/10.1063/5.0203518.
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