Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/107015
DC Field | Value | Language |
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dc.contributor | Department of Electrical and Electronic Engineering | - |
dc.creator | Pechprasarn, S | en_US |
dc.creator | Chow, TWK | en_US |
dc.creator | Somekh, MG | en_US |
dc.date.accessioned | 2024-06-07T00:59:38Z | - |
dc.date.available | 2024-06-07T00:59:38Z | - |
dc.identifier.uri | http://hdl.handle.net/10397/107015 | - |
dc.language.iso | en | en_US |
dc.publisher | Nature Publishing Group | en_US |
dc.rights | © The Author(s) 2018 | en_US |
dc.rights | This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. | en_US |
dc.rights | The following publication Pechprasarn, S., Chow, T.W.K. & Somekh, M.G. Application of confocal surface wave microscope to self-calibrated attenuation coefficient measurement by Goos-Hänchen phase shift modulation. Sci Rep 8, 8547 (2018) is available at https://doi.org/10.1038/s41598-018-26424-2. | en_US |
dc.title | Application of confocal surface wave microscope to self-calibrated attenuation coefficient measurement by Goos-Hänchen phase shift modulation | en_US |
dc.type | Journal/Magazine Article | en_US |
dc.identifier.volume | 8 | en_US |
dc.identifier.doi | 10.1038/s41598-018-26424-2 | en_US |
dcterms.abstract | In this paper, we present a direct method to measure surface wave attenuation arising from both ohmic and coupling losses using our recently developed phase spatial light modulator (phase-SLM) based confocal surface plasmon microscope. The measurement is carried out in the far-field using a phase-SLM to impose an artificial surface wave phase profile in the back focal plane (BFP) of a microscope objective. In other words, we effectively provide an artificially engineered backward surface wave by modulating the Goos Hänchen (GH) phase shift of the surface wave. Such waves with opposing phase and group velocities are well known in acoustics and electromagnetic metamaterials but usually require structured or layered surfaces, here the effective wave is produced externally in the microscope illumination path. Key features of the technique developed here are that it (i) is self-calibrating and (ii) can distinguish between attenuation arising from ohmic loss (k″ Ω ) and coupling (reradiation) loss (k″ c ). This latter feature has not been achieved with existing methods. In addition to providing a unique measurement the measurement occurs of over a localized region of a few microns. The results were then validated against the surface plasmons (SP) dip measurement in the BFP and a theoretical model based on a simplified Green’s function. | - |
dcterms.accessRights | open access | en_US |
dcterms.bibliographicCitation | Scientific reports, 2018, v. 8, 8547 | en_US |
dcterms.isPartOf | Scientific reports | en_US |
dcterms.issued | 2018 | - |
dc.identifier.scopus | 2-s2.0-85048196574 | - |
dc.identifier.eissn | 2045-2322 | en_US |
dc.identifier.artn | 8547 | en_US |
dc.description.validate | 202405 bcch | - |
dc.description.oa | Version of Record | en_US |
dc.identifier.FolderNumber | EIE-0939 | - |
dc.description.fundingSource | Others | en_US |
dc.description.fundingText | ITF grant; PolyU Postdoctoral Fellowship award for SP | en_US |
dc.description.pubStatus | Published | en_US |
dc.identifier.OPUS | 6845214 | - |
dc.description.oaCategory | CC | en_US |
Appears in Collections: | Journal/Magazine Article |
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File | Description | Size | Format | |
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s41598-018-26424-2.pdf | 3.55 MB | Adobe PDF | View/Open |
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