Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/106338
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Title: Subsurface defect detection using phase evolution of line laser-generated Rayleigh waves
Authors: Chen, D
Lv, G
Guo, S
Zuo, R
Liu, Y
Zhang, K
Su, Z 
Feng, W
Issue Date: Nov-2020
Source: Optics and laser technology, Nov. 2020, v. 131, 106410
Abstract: An unreported phenomenon of phase evolution of Rayleigh ultrasonic waves with subsurface defects is observed and systematically explored for detection of subsurface defects using non-contact line laser ultrasonic technique and numerical simulation. The mechanism of phase evolution of Rayleigh wave signals is explained by the interference of the reflected and direct Rayleigh wave, explored by finite element analysis. Both experiments and simulation show distinct peak evolution of the Rayleigh wave signals with the width and depth of subsurface defect. A dimensionless parameter (|Neg|/Pos), defined by the ratio of absolute negative peak to positive peak of Rayleigh wave, is proposed to evaluate the phase evolution of Rayleigh wave with defect width and depth, which is further used to quantify the subsurface defects. The phase evolution of Rayleigh waves can act as a robust and sensitive feature to detect subsurface defects using laser-generated ultrasound, which has promising applications in life prediction and health monitoring of various engineering structures.
Keywords: Laser ultrasonics
Nondestructive evaluation
Phase evolution
Rayleigh wave
Subsurface defects
Publisher: Elsevier Ltd
Journal: Optics and laser technology 
EISSN: 0030-3992
DOI: 10.1016/j.optlastec.2020.106410
Rights: © 2020 Elsevier Ltd. All rights reserved.
© 2020. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/.
The following publication Chen, D., Lv, G., Guo, S., Zuo, R., Liu, Y., Zhang, K., ... & Feng, W. (2020). Subsurface defect detection using phase evolution of line laser-generated Rayleigh waves. Optics & Laser Technology, 131, 106410 is available at https://doi.org/10.1016/j.optlastec.2020.106410.
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