Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/104515
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dc.contributorDepartment of Industrial and Systems Engineering-
dc.creatorRen, Men_US
dc.creatorKong, Len_US
dc.creatorSun, Len_US
dc.creatorCheung, Cen_US
dc.date.accessioned2024-02-05T08:50:43Z-
dc.date.available2024-02-05T08:50:43Z-
dc.identifier.issn0018-9456en_US
dc.identifier.urihttp://hdl.handle.net/10397/104515-
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.rights© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en_US
dc.rightsThe following publication Ren, M., Kong, L., Sun, L., & Cheung, C. (2017). A Curve Network Sampling Strategy for Measurement of Freeform Surfaces on Coordinate Measuring Machines. IEEE Transactions on Instrumentation and Measurement, 66(11), 3032–3043 is available at https://doi.org/10.1109/TIM.2017.2717283.en_US
dc.subjectCoordinate measuring machine (CMM)en_US
dc.subjectFree-form surfaceen_US
dc.subjectMeasurementen_US
dc.subjectSampling strategyen_US
dc.titleA curve network sampling strategy for measurement of freeform surfaces on coordinate measuring machinesen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage3032en_US
dc.identifier.epage3043en_US
dc.identifier.volume66en_US
dc.identifier.issue11en_US
dc.identifier.doi10.1109/TIM.2017.2717283en_US
dcterms.abstractOne of the essential problems in the measurement of the freeform surfaces on a coordinate measuring machine is to design appropriate sampling plans to improve the industrial practice in terms of the tradeoff between the sampling accuracy and the efficiency. This paper presents a curve network sampling strategy to approximate the measured surface within a required accuracy while minimizing the cost and time for the measurement by adaptively deriving the optimal sampling locations. The method iteratively extracts two sets of iso-planar curves along two different directions on the parts to form a curve network, which is used to reconstruct the measured surfaces based on the Gordon surface fitting method. Two criteria are integrated to determine the locations of the sampled curves in the sampling process, including the surface complexity and the deviation of the reconstructed surfaces from the CAD model. Both the computer simulation and the actual measurement are conducted to verify the superior sampling efficiency of the proposed method to the conventional raster fashion sampling in measuring freeform surfaces.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationIEEE transactions on instrumentation and measurement, Nov. 2017, v. 66, no. 11, p. 3032-3043en_US
dcterms.isPartOfIEEE transactions on instrumentation and measurementen_US
dcterms.issued2017-11-
dc.identifier.scopus2-s2.0-85028926304-
dc.identifier.eissn1557-9662en_US
dc.description.validate202402 bcch-
dc.description.oaAccepted Manuscripten_US
dc.identifier.FolderNumberISE-0750-
dc.description.fundingSourceOthersen_US
dc.description.fundingTextNational Natural Science Foundation of China; Shanghai Pujiang Program of Chinaen_US
dc.description.pubStatusPublisheden_US
dc.identifier.OPUS6779593-
dc.description.oaCategoryGreen (AAM)en_US
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