Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/104372
PIRA download icon_1.1View/Download Full Text
DC FieldValueLanguage
dc.contributorDepartment of Industrial and Systems Engineeringen_US
dc.creatorWang, Ren_US
dc.creatorCheung, CFen_US
dc.date.accessioned2024-02-05T08:49:13Z-
dc.date.available2024-02-05T08:49:13Z-
dc.identifier.isbn978-1-6654-0354-2 (Electronic ISBN)en_US
dc.identifier.isbn978-1-6654-4779-9 (Print on Demand (PoD))en_US
dc.identifier.urihttp://hdl.handle.net/10397/104372-
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.rights©2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en_US
dc.rightsThe following publication R. Wang and C. F. Cheung, "3D Super-resolution Optical Imaging Using Deep Image Prior," 2021 International Conference of Optical Imaging and Measurement (ICOIM), Xi'an, China, 2021, pp. 5-8 is available at https://doi.org/10.1109/ICOIM52180.2021.9524418.en_US
dc.subjectDeep image prioren_US
dc.subjectDeep learningen_US
dc.subjectMeasurementen_US
dc.subjectOptical imagingen_US
dc.subjectPrecision metrologyen_US
dc.subjectPrecision surface measurementen_US
dc.subjectSuper-resolutuonen_US
dc.title3D super-resolution optical imaging using deep image prioren_US
dc.typeConference Paperen_US
dc.identifier.spage5en_US
dc.identifier.epage8en_US
dc.identifier.doi10.1109/ICOIM52180.2021.9524418en_US
dcterms.abstractDeep learning based super-resolution methods have received much attention, especially unsupervised super-resolution due to the difficulty of collecting images pairs (low-resolution and high-resolution images from the same scenario) in many fields, such as optics. Optical imaging is typical technique in advance optical measurement equipment and optical super-resolution imaging has received much attention. In this paper, a novel model, deep image prior with design surface model (DIP-DSM), based on deep image prior to improve the resolution of optical imaging is presented. It makes use of single image instead of using random input in which the design surface model is regarded as prior information. To validate the model, a series of experiments are conducted, and the results show the superiority of the proposed model as compared with deep image prior. Furthermore, the performance of different neural networks are explored and it is find that the U-Net achieve best reconstruction quality and reach to PSNR, 32.937.en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitation2021 International Conference of Optical Imaging and Measurement (ICOIM), Xi’an, China, August 27-29, 2021, p. 5-8en_US
dcterms.issued2021-
dc.identifier.scopus2-s2.0-85115445116-
dc.relation.conferenceInternational Conference of Optical Imaging and Measurement [ICOIM]en_US
dc.description.validate202402 bcchen_US
dc.description.oaAccepted Manuscripten_US
dc.identifier.FolderNumberISE-0089-
dc.description.fundingSourceRGCen_US
dc.description.fundingSourceOthersen_US
dc.description.fundingTextPolyUen_US
dc.description.pubStatusPublisheden_US
dc.identifier.OPUS60277244-
dc.description.oaCategoryGreen (AAM)en_US
Appears in Collections:Conference Paper
Files in This Item:
File Description SizeFormat 
Wang_3D_Super-Resolution_Optical.pdfPre-Published version1.89 MBAdobe PDFView/Open
Open Access Information
Status open access
File Version Final Accepted Manuscript
Access
View full-text via PolyU eLinks SFX Query
Show simple item record

Page views

107
Last Week
5
Last month
Citations as of Nov 30, 2025

Downloads

94
Citations as of Nov 30, 2025

SCOPUSTM   
Citations

1
Citations as of Dec 19, 2025

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.