Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/104371
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dc.contributorDepartment of Industrial and Systems Engineeringen_US
dc.creatorWen, Hen_US
dc.creatorSu, Yen_US
dc.creatorWang, Zen_US
dc.creatorJin, Sen_US
dc.creatorRen, Jen_US
dc.creatorShen, Wen_US
dc.creatorEden, Men_US
dc.date.accessioned2024-02-05T08:49:11Z-
dc.date.available2024-02-05T08:49:11Z-
dc.identifier.issn0001-1541en_US
dc.identifier.urihttp://hdl.handle.net/10397/104371-
dc.language.isoenen_US
dc.publisherJohn Wiley & Sons, Inc.en_US
dc.rights© 2021 American Institute of Chemical Engineers.en_US
dc.rightsThis is the peer reviewed version of the following article: Wen, H, Su, Y, Wang, Z, et al. A systematic modeling methodology of deep neural network-based structure-property relationship for rapid and reliable prediction on flashpoints. AIChE J. 2022; 68( 1): e17402, which has been published in final form at https://doi.org/10.1002/aic.17402. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions. This article may not be enhanced, enriched or otherwise transformed into a derivative work, without express permission from Wiley or by statutory rights under applicable legislation. Copyright notices must not be removed, obscured or modified. The article must be linked to Wiley’s version of record on Wiley Online Library and any embedding, framing or otherwise making available the article or pages thereof by third parties from platforms, services and websites other than Wiley Online Library must be prohibited.en_US
dc.subjectDeep neural networken_US
dc.subjectFlashpointen_US
dc.subjectPrincipal componentnalysisen_US
dc.subjectQSPRen_US
dc.subjectUncertainty analysisen_US
dc.titleA systematic modeling methodology of deep neural network-based structure-property relationship for rapid and reliable prediction on flashpointsen_US
dc.typeJournal/Magazine Articleen_US
dc.description.otherinformationTitle on author's file: A systematic DNN-based QSPR modeling methodology for rapid and reliable prediction on flashpoints of chemicalsen_US
dc.identifier.volume68en_US
dc.identifier.issue1en_US
dc.identifier.doi10.1002/aic.17402en_US
dcterms.abstractDeep neural networks (DNNs) based quantitative structure–property relationship (QSPR) studies are receiving increasing attention due to their excellent performances. A systematic methodology coupling multiple machine learning technologies is proposed to systematically solve vital problems including applicability domain and prediction uncertainty in DNN-based QSPR modeling. Key features are rapidly extracted from plentiful but chaotic descriptors by principal component analysis (PCA) and kernel PCA. Then, a detailed applicability domain (AD) is defined by K-means algorithm to avoid unreliable predictions and discover its potential impact on prediction uncertainty. Moreover, prediction uncertainty is analyzed with dropout-embedded DNN by thousands of independent tests to assess the reliability of predictions. The prediction of flashpoint temperature is employed as a case study, demonstrating that the model accuracy is remarkably improved comparing with the referenced model. Furthermore, the proposed methodology breaks through difficulties in analyzing the uncertainty of DNN-based QSPRs and presents an AD correlated with the uncertainty.en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationAiche journal, Jan. 2022, v. 68, no. 1, e17402en_US
dcterms.isPartOfAiche journalen_US
dcterms.issued2022-01-
dc.identifier.scopus2-s2.0-85113496187-
dc.identifier.eissn1547-5905en_US
dc.identifier.artne17402en_US
dc.description.validate202402 bcchen_US
dc.description.oaAccepted Manuscripten_US
dc.identifier.FolderNumberISE-0020-
dc.description.fundingSourceOthersen_US
dc.description.fundingTextChongqing Innovation Support Program for Returned Overseas Chinese Scholars; National Natural Science Foundation of Chinaen_US
dc.description.pubStatusPublisheden_US
dc.identifier.OPUS55697419-
dc.description.oaCategoryGreen (AAM)en_US
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