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Title: Robust extreme learning fuzzy systems using ridge regression for small and noisy datasets
Authors: Zhang, T
Deng, Z
Choi, KS 
Liu, J
Wang, S
Issue Date: 2017
Source: In Proceedings of 2017 IEEE International Conference on Fuzzy Systems (FUZZ-IEEE), Naples, Italy, 09-12 July 2017, p. 1-7
Abstract: Fuzzy Extreme Learning Machine (F-ELM) constructs a fuzzy neural networks by embedding fuzzy membership functions and rules into the hidden layer of extreme learning machine (ELM), that is, it can be interpreted as a fuzzy system with the structure of neural network. Although F-ELM has shown the characteristics of fast learning of model parameters, it has poor robustness to small and noisy datasets since its parameters connecting hidden layer with output layer are optimized by least square(LS). In order to overcome this challenge, a Ridge Regression based Extreme Learning Fuzzy System (RR-EL-FS) is presented in this study, which has introduced the strategy of ridge regression into F-ELM to enhance the robustness. The experimental results also validate that the performance of RR-EL-FS is better than F-ELM and some related methods to small and noisy datasets.
Publisher: IEEE
ISBN: 978-1-5090-6034-4 (Electronic)
978-1-5090-6033-7 (USB)
978-1-5090-6035-1 (Print on Demand)
DOI: 10.1109/FUZZ-IEEE.2017.8015417
Description: 2017 IEEE International Conference on Fuzzy Systems (FUZZ-IEEE), 09-12 July 2017, Naples, Italy
Rights: © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
The following publication T. Zhang, Z. Deng, K. S. Choi, J. Liu and S. Wang, "Robust extreme learning fuzzy systems using ridge regression for small and noisy datasets," 2017 IEEE International Conference on Fuzzy Systems (FUZZ-IEEE), Naples, Italy, 2017, p. 1-7 is available at https://doi.org/10.1109/FUZZ-IEEE.2017.8015417.
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