Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/103655
| DC Field | Value | Language |
|---|---|---|
| dc.contributor | School of Nursing | - |
| dc.creator | Lou, Q | en_US |
| dc.creator | Deng, Z | en_US |
| dc.creator | Wang, G | en_US |
| dc.creator | Choi, KS | en_US |
| dc.date.accessioned | 2024-01-02T03:09:44Z | - |
| dc.date.available | 2024-01-02T03:09:44Z | - |
| dc.identifier.isbn | 978-1-7281-2348-6 (Electronic) | en_US |
| dc.identifier.isbn | 978-1-7281-2349-3 (Print on Demand) | en_US |
| dc.identifier.uri | http://hdl.handle.net/10397/103655 | - |
| dc.description | 2019 IEEE 14th International Conference on Intelligent Systems and Knowledge Engineering (ISKE), 14-16 November 2019, Dalian, China | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | IEEE | en_US |
| dc.rights | © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | en_US |
| dc.rights | The following publication Q. Lou, Z. Deng, G. Wang and K. S. Choi, "Reliability Learning for Interval Type-2 TSK Fuzzy Logic System with its Application to Medical Diagnosis," 2019 IEEE 14th International Conference on Intelligent Systems and Knowledge Engineering (ISKE), Dalian, China, 2019, pp. 43-50 is available at https://doi.org/10.1109/ISKE47853.2019.9170445. | en_US |
| dc.subject | Classification | en_US |
| dc.subject | Minimax probability decision | en_US |
| dc.subject | Model reliability | en_US |
| dc.subject | Type-2 fuzzy logic system | en_US |
| dc.title | Reliability learning for interval type-2 TSK fuzzy logic system with its application to medical diagnosis | en_US |
| dc.type | Conference Paper | en_US |
| dc.description.otherinformation | Title on author’s file: Reliability Learning for Interval Type-2 TSK Fuzzy Logic System Classifier | en_US |
| dc.identifier.spage | 43 | en_US |
| dc.identifier.epage | 50 | en_US |
| dc.identifier.doi | 10.1109/ISKE47853.2019.9170445 | en_US |
| dcterms.abstract | To apply intelligent model in serious practical applications like medical diagnosis, the reliability and interpretability of the model are very important to users. Among the existing intelligent models, type-2 fuzzy systems are distinctive in interpretability and modeling uncertainty. However, like most existing models, the reliability determination of fuzzy system for recognition task training is an unsolved problem. In this study, a method of constructing minimax probability interval type-2 TSK fuzzy logic system classifier (MP-IT2TSK-FLSC) based on reliability learning is proposed. The classifier can provide the lower limit of the correct classification of the model and is an important index to quantify the reliability of the model. Experimental results on medical datasets have demonstrated the advantages of this method, exhibiting remarkable interpretability and reliability of the proposed fuzzy classifier. | - |
| dcterms.accessRights | open access | en_US |
| dcterms.bibliographicCitation | In Proceedings of 2019 IEEE 14th International Conference on Intelligent Systems and Knowledge Engineering (ISKE), Dalian, China, 14-16 November 2019, p. 43-50 | en_US |
| dcterms.issued | 2019 | - |
| dc.identifier.scopus | 2-s2.0-85091524317 | - |
| dc.relation.ispartofbook | 2019 IEEE 14th International Conference on Intelligent Systems and Knowledge Engineering (ISKE) | en_US |
| dc.relation.conference | International Conference on Intelligent Systems and Knowledge Engineering [ISKE] | - |
| dc.description.validate | 202312 bckw | - |
| dc.description.oa | Accepted Manuscript | en_US |
| dc.identifier.FolderNumber | SN-0234 | - |
| dc.description.fundingSource | RGC | en_US |
| dc.description.fundingSource | Others | en_US |
| dc.description.fundingText | National Natural Science Foundation of China; Ministry of Education Program for New Century Excellent Talents | en_US |
| dc.description.pubStatus | Published | en_US |
| dc.identifier.OPUS | 53369450 | - |
| dc.description.oaCategory | Green (AAM) | en_US |
| Appears in Collections: | Conference Paper | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Choi_Reliability_Learning_Interval.pdf | Pre-Published version | 610.71 kB | Adobe PDF | View/Open |
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