Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/101539
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dc.contributorDepartment of Applied Biology and Chemical Technologyen_US
dc.creatorWang, Len_US
dc.creatorZhou, Hen_US
dc.creatorHu, Jen_US
dc.creatorHuang, Ben_US
dc.creatorSun, Men_US
dc.creatorDong, Ben_US
dc.creatorZheng, Gen_US
dc.creatorHuang, Yen_US
dc.creatorChen, Yen_US
dc.creatorLi, Len_US
dc.creatorXu, Zen_US
dc.creatorLi, Nen_US
dc.creatorLiu, Zen_US
dc.creatorChen, Qen_US
dc.creatorSun, LDen_US
dc.creatorYan, CHen_US
dc.date.accessioned2023-09-18T07:30:50Z-
dc.date.available2023-09-18T07:30:50Z-
dc.identifier.issn0036-8075en_US
dc.identifier.urihttp://hdl.handle.net/10397/101539-
dc.language.isoenen_US
dc.publisherAmerican Association for the Advancement of Scienceen_US
dc.rightsCopyright © 2019 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Worksen_US
dc.rightsThis is the accepted version of the following article: Wang, L., Zhou, H., Hu, J., Huang, B., Sun, M., Dong, B., ... & Yan, C. H. (2019). A Eu3+-Eu2+ ion redox shuttle imparts operational durability to Pb-I perovskite solar cells. Science, 363(6424), 265-270, which has been published in https://www.science.org/journal/science.en_US
dc.titleA Eu³⁺-Eu²⁺ ion redox shuttle imparts operational durability to Pb-I perovskite solar cellsen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage265en_US
dc.identifier.epage270en_US
dc.identifier.volume363en_US
dc.identifier.issue6424en_US
dc.identifier.doi10.1126/science.aau5701en_US
dcterms.abstractThe components with soft nature in the metal halide perovskite absorber usually generate lead (Pb)0 and iodine (I)0 defects during device fabrication and operation. These defects serve as not only recombination centers to deteriorate device efficiency but also degradation initiators to hamper device lifetimes. We show that the europium ion pair Eu³⁺-Eu²⁺ acts as the “redox shuttle” that selectively oxidized Pb0 and reduced I0 defects simultaneously in a cyclical transition. The resultant device achieves a power conversion efficiency (PCE) of 21.52% (certified 20.52%) with substantially improved long-term durability. The devices retained 92% and 89% of the peak PCE under 1-sun continuous illumination or heating at 85°C for 1500 hours and 91% of the original stable PCE after maximum power point tracking for 500 hours, respectively.en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationScience, 18 Jan. 2019, v. 363, no. 6424, p. 265-270en_US
dcterms.isPartOfScienceen_US
dcterms.issued2019-01-18-
dc.identifier.scopus2-s2.0-85060131133-
dc.identifier.pmid30655439-
dc.identifier.eissn1095-9203en_US
dc.description.validate202308 bckwen_US
dc.description.oaAccepted Manuscripten_US
dc.identifier.FolderNumberABCT-0432-
dc.description.fundingSourceOthersen_US
dc.description.fundingTextNational Natural Science Foundation of China; MOST of China; National Key Research and Development Program of China; Beijing Natural Science Foundation; National Key Research and Development Program of China; Beijing Municipal Science and Technology Project; Young Talent Thousand Programen_US
dc.description.pubStatusPublisheden_US
dc.identifier.OPUS12954306-
dc.description.oaCategoryGreen (AAM)en_US
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