Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/101431
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dc.contributorDepartment of Industrial and Systems Engineeringen_US
dc.creatorCao, Len_US
dc.creatorWang, Jen_US
dc.creatorZhang, Qen_US
dc.creatorDuan, Zen_US
dc.creatorWang, Ten_US
dc.creatorTang, Yen_US
dc.creatorZhao, Xen_US
dc.creatorChen, Zen_US
dc.creatorWang, Fen_US
dc.date.accessioned2023-09-18T02:25:45Z-
dc.date.available2023-09-18T02:25:45Z-
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://hdl.handle.net/10397/101431-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2023 Author(s). Published under an exclusive license by AIP Publishing.en_US
dc.rightsThis article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Liang Cao, Jiasheng Wang, Qiaozhen Zhang, Zhihua Duan, Tao Wang, Yanxue Tang, Xiangyong Zhao, Zibin Chen, Feifei Wang; Finite element analysis of transverse size effect on the pyroelectric Pb(In1/2Nb1/2)O3–Pb(Mg1/3Nb2/3)O3 –PbTiO3 thin film for infrared array applications. Appl. Phys. Lett. 19 June 2023; 122 (25): 252901 and may be found at https://dx.doi.org/10.1063/5.0145118.en_US
dc.titleFinite element analysis of transverse size effect on the pyroelectric Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3 -PbTiO3 thin film for infrared array applicationsen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume122en_US
dc.identifier.issue25en_US
dc.identifier.doi10.1063/5.0145118en_US
dcterms.abstractExploring and revealing the influence of the pyroelectric thin film array element size on its structure and pyroelectric performance is crucial for designing integrated pyroelectric infrared detectors. In this work, the transverse size effect on the piezoelectric, dielectric, and especially the pyroelectric properties for a new-generation relaxor ferroelectric material Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 (PIMNT) was studied by a finite element method. The lateral size-dependent piezoelectric and dielectric properties of the PIMNT thin film indicated that with the decrease in the transverse size, the piezoelectric constant d33 and relative dielectric constant ϵr increased substantially. The piezoelectric constant d33 and relative dielectric constant ϵr along ⟨001⟩ and ⟨011⟩ orientation increased faster than those along ⟨111⟩. A critical aspect ratio (in this paper, it was defined as radius/thickness) was found around 1:1 for three directions. We further discovered that the pyroelectric coefficient for PIMNT thin film along the ⟨111⟩ direction (the best crystallographic orientation for pyroelectric performance) decreased from 8.5 × 10−4 to 8.0 × 10−4 C/(m2·K) with the aspect ratio down to 0.01. The variation of the piezoelectric, dielectric, and pyroelectric properties originated from the declamping of the PIMNT thin film from the substrate. This finding gives insight into the transverse size effect on the electrical properties of new-generation relaxor PIMNT thin film and provides a guidance for designing high-performance infrared array detectors.en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 19 June 2023, v. 122, no. 25, 252901en_US
dcterms.isPartOfApplied physics lettersen_US
dcterms.issued2023-06-
dc.identifier.scopus2-s2.0-85163191971-
dc.identifier.ros2022002211-
dc.identifier.eissn1077-3118en_US
dc.identifier.artn252901en_US
dc.description.validate202309 bckwen_US
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberCDCF_2022-2023-
dc.description.fundingSourceRGCen_US
dc.description.fundingSourceOthersen_US
dc.description.fundingTextNational Natural Science Foundation of China; National Natural Science Youth Foundation of China; Research and Development Program in Significant Area of Guangzhou City; Hong Kong Polytechnic Universityen_US
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryVoR alloweden_US
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