Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/100550
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dc.contributorDepartment of Electrical and Electronic Engineeringen_US
dc.creatorZhang, Xen_US
dc.creatorBruce, Aen_US
dc.creatorRowland, Sen_US
dc.creatorTerzija, Ven_US
dc.creatorBu, Sen_US
dc.date.accessioned2023-08-11T03:10:25Z-
dc.date.available2023-08-11T03:10:25Z-
dc.identifier.issn1070-9878en_US
dc.identifier.urihttp://hdl.handle.net/10397/100550-
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineersen_US
dc.rightsPersonal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en_US
dc.rightsThe following publication X. Zhang, A. Bruce, S. Rowland, V. Terzija and S. Bu, "Modeling the development of low current arcs and arc resistance simulation," in IEEE Transactions on Dielectrics and Electrical Insulation, vol. 25, no. 6, pp. 2049-2057, Dec. 2018 is available at https://doi.org/10.1109/TDEI.2018.007100.en_US
dc.subjectArc dischargesen_US
dc.subjectArc resistanceen_US
dc.subjectCondition monitoringen_US
dc.subjectEnergyen_US
dc.subjectHigh voltage testingen_US
dc.subjectInsulatorsen_US
dc.subjectLeakage currentsen_US
dc.subjectModelingen_US
dc.subjectPSCAD/EMTDCen_US
dc.subjectSimulationen_US
dc.titleModeling the development of low current arcs and arc resistance simulationen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage2049en_US
dc.identifier.epage2057en_US
dc.identifier.volume25en_US
dc.identifier.issue6en_US
dc.identifier.doi10.1109/TDEI.2018.007100en_US
dcterms.abstractLow current arcs in the range 0.5 ∼5 mA occur in power networks in situations such as on overhead line insulators and cable terminations. These arcs are important because of their potential contribution to surface ageing, asset failure and potential flashover. In this paper, the development of low current arcs is classified in three stages: a formative leakage current phase (∼μA), a stage where discharges occur but are unstable with each half power cycle (<1 mA) and a period of stable discharges (>1 mA). Arc resistance is a key element in controlling arc behavior in each stage, and is modeled as the combination of a stable arc resistance, an oscillating resistance and a surface resistance. The resulting arc model has been developed in PSCAD/EMTDC, to simulate an arc/discharge in each development stage. Simulations compare well with experimental data. The simulation reveals that peak arc current plays a key role in the transition from an unstable to stable arc. Analysis shows a significant increase in discharge energy as a result of its stabilization. These models explain the conditions required for accelerated ageing of polymeric insulators and can be used to design and interpret testing regimes, and for polymeric insulator asset management.en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationIEEE transactions on dielectrics and electrical insulation, Dec. 2018, v. 25, no. 6, p. 2049-2057en_US
dcterms.isPartOfIEEE transactions on dielectrics and electrical insulationen_US
dcterms.issued2018-12-
dc.identifier.scopus2-s2.0-85058279030-
dc.identifier.eissn1558-4135en_US
dc.description.validate202307 bckwen_US
dc.description.oaAccepted Manuscripten_US
dc.identifier.FolderNumberEE-0296-
dc.description.fundingSourceSelf-fundeden_US
dc.description.pubStatusPublisheden_US
dc.identifier.OPUS25169762-
dc.description.oaCategoryGreen (AAM)en_US
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