Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/100461
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dc.contributorDepartment of Electrical and Electronic Engineeringen_US
dc.creatorYe, Qen_US
dc.creatorWang, LWen_US
dc.creatorLun, DPKen_US
dc.date.accessioned2023-08-11T03:05:59Z-
dc.date.available2023-08-11T03:05:59Z-
dc.identifier.urihttp://hdl.handle.net/10397/100461-
dc.language.isoenen_US
dc.publisherOptica Publishing Group (formerly OSA)en_US
dc.rights© 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement (https://doi.org/10.1364/OA_License_v2#VOR-OA). Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reserved.en_US
dc.rightsThe folowing publication Qiuliang Ye, Li-Wen Wang, and Daniel P. K. Lun, "SiSPRNet: end-to-end learning for single-shot phase retrieval," Opt. Express 30, 31937-31958 (2022) is available at https://doi.org/10.1364/OE.464086.en_US
dc.titleSiSPRNet : end-to-end learning for single-shot phase retrievalen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage31937en_US
dc.identifier.epage31958en_US
dc.identifier.volume30en_US
dc.identifier.issue18en_US
dc.identifier.doi10.1364/OE.464086en_US
dcterms.abstractWith the success of deep learning methods in many image processing tasks, deep learning approaches have also been introduced to the phase retrieval problem recently. These approaches are different from the traditional iterative optimization methods in that they usually require only one intensity measurement and can reconstruct phase images in real-time. However, because of tremendous domain discrepancy, the quality of the reconstructed images given by these approaches still has much room to improve to meet the general application requirements. In this paper, we design a novel deep neural network structure named SiSPRNet for phase retrieval based on a single Fourier intensity measurement. To effectively utilize the spectral information of the measurements, we propose a new feature extraction unit using the Multi-Layer Perceptron (MLP) as the front end. It allows all pixels of the input intensity image to be considered together for exploring their global representation. The size of the MLP is carefully designed to facilitate the extraction of the representative features while reducing noises and outliers. A dropout layer is also equipped to mitigate the possible overfitting problem in training the MLP. To promote the global correlation in the reconstructed images, a self-attention mechanism is introduced to the Up-sampling and Reconstruction (UR) blocks of the proposed SiSPRNet. These UR blocks are inserted into a residual learning structure to prevent the weak information flow and vanishing gradient problems due to their complex layer structure. Extensive evaluations of the proposed model are performed using different testing datasets of phase-only images and images with linearly related magnitude and phase. Experiments were conducted on an optical experimentation platform (with defocusing to reduce the saturation problem) to understand the performance of different deep learning methods when working in a practical environment. The results demonstrate that the proposed approach consistently outperforms other deep learning methods in single-shot maskless phase retrieval. The source codes of the proposed method have been released in Github [see references].en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationOptical express, 29 Aug. 2022, v. 30, no. 18, p. 31937-31958en_US
dcterms.isPartOfOptical expressen_US
dcterms.issued2022-08-29-
dc.identifier.scopus2-s2.0-85136202094-
dc.identifier.pmid36242266-
dc.identifier.eissn1094-4087en_US
dc.description.validate202308 bcchen_US
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_Scopus/WOSen_US
dc.description.fundingSourceRGCen_US
dc.description.fundingSourceOthersen_US
dc.description.fundingTextCentre Centre for Advances in Reliability and Safety; Centre for Advances in Reliability and Safetyen_US
dc.description.pubStatusPublisheden_US
dc.description.oaCategoryVoR alloweden_US
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