Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/100282
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dc.contributorDepartment of Applied Physicsen_US
dc.creatorZhang, Fen_US
dc.creatorLv, Pen_US
dc.creatorZhang, Yen_US
dc.creatorHuang, Sen_US
dc.creatorWong, CMen_US
dc.creatorYau, HMen_US
dc.creatorChen, Xen_US
dc.creatorWen, Zen_US
dc.creatorJiang, Xen_US
dc.creatorZeng, Cen_US
dc.creatorHong, Jen_US
dc.creatorDai, Jen_US
dc.date.accessioned2023-08-08T01:54:34Z-
dc.date.available2023-08-08T01:54:34Z-
dc.identifier.issn0031-9007en_US
dc.identifier.urihttp://hdl.handle.net/10397/100282-
dc.language.isoenen_US
dc.publisherAmerican Physical Societyen_US
dc.rights© 2019 American Physical Societyen_US
dc.rightsThe following publication Zhang, F., Lv, P., Zhang, Y., Huang, S., Wong, C. -., Yau, H. -., . . . Dai, J. -. (2019). Modulating the electrical transport in the two-dimensional electron gas at LaAlO3/SrTiO3 heterostructures by interfacial flexoelectricity. Physical Review Letters, 122(25), 257601 is available at https://doi.org/10.1103/PhysRevLett.122.257601.en_US
dc.titleModulating the electrical transport in the two-dimensional electron gas at LaAlO3/SrTiO3 heterostructures by interfacial flexoelectricityen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.volume122en_US
dc.identifier.issue25en_US
dc.identifier.doi10.1103/PhysRevLett.122.257601en_US
dcterms.abstractThin film flexoelectricity is attracting more attention because of its enhanced effect and potential application in electronic devices. Here we find that a mechanical bending induced flexoelectricity significantly modulates the electrical transport properties of the interfacial two-dimensional electron gas (2DEG) at the LaAlO3/SrTiO3 (LAO/STO) heterostructure. Under variant bending states, both the carrier density and mobility of the 2DEG are changed according to the flexoelectric polarization direction, showing an electric field effect modulation. By measuring the flexoelectric response of LAO, it is found that the effective flexoelectricity in the LAO thin film is enhanced by 3 orders compared to its bulk. These results broaden the horizon of study on the flexoelectricity effect in the hetero-oxide interface and more research on the oxide interfacial flexoelectricity may be stimulated.en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationPhysical review letters, 28 June 2019, v. 122, no. 25, 257601en_US
dcterms.isPartOfPhysical review lettersen_US
dcterms.issued2019-06-28-
dc.identifier.scopus2-s2.0-85068619943-
dc.identifier.pmid31347866-
dc.identifier.eissn1079-7114en_US
dc.identifier.artn257601en_US
dc.description.validate202308 bcvcen_US
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberAP-0316-
dc.description.fundingSourceRGCen_US
dc.description.fundingSourceOthersen_US
dc.description.fundingTextThe Hong Kong ITF; The National Science Foundation of China; the Thousand Young Talents Program of China; The NSFC-Guangdong Joint Funden_US
dc.description.pubStatusPublisheden_US
dc.identifier.OPUS23734052-
dc.description.oaCategoryVoR alloweden_US
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