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Title: Intrinsic conductance of domain walls in BiFeO3
Authors: Zhang, Y
Lu, H
Yan, X
Cheng, X
Xie, L
Aoki, T
Li, L
Heikes, C
Lau, SP 
Schlom, DG
Chen, L
Gruverman, A
Pan, X
Issue Date: 6-Sep-2019
Source: Advanced materials, 6 Sept. 2019, v. 31, no. 36, 1902099
Abstract: Ferroelectric domain walls exhibit a number of new functionalities that are not present in their host material. One of these functional characteristics is electrical conductivity that may lead to future device applications. Although progress has been made, the intrinsic conductivity of BiFeO3 domain walls is still elusive. Here, the intrinsic conductivity of 71° and 109° domain walls is reported by probing the local conductance over a cross section of the BiFeO3/TbScO3 (001) heterostructure. Through a combination of conductive atomic force microscopy, high-resolution electron energy loss spectroscopy, and phase-field simulations, it is found that the 71° domain wall has an inherently charged nature, while the 109° domain wall is close to neutral. Hence, the intrinsic conductivity of the 71° domain walls is an order of magnitude larger than that of the 109° domain walls associated with bound-charge-induced bandgap lowering. Furthermore, the interaction of adjacent 71° domain walls and domain wall curvature leads to a variation of the charge distribution inside the walls, and causes a discontinuity of potential in the [110]p direction, which results in an alternative conductivity of the neighboring 71° domain walls, and a low conductivity of the 71° domain walls when measurement is taken from the film top surface.
Keywords: Conductive atomic force microscopy
Domain walls
Ferroelectric films
Intrinsic conductance
Piezoresponse force microscopy
Publisher: Wiley-VCH
Journal: Advanced materials 
ISSN: 0935-9648
EISSN: 1521-4095
DOI: 10.1002/adma.201902099
Rights: © 2019 Wiley-VCH Verlag GmbH & Co. KGaA,Weinheim
This is the peer reviewed version of the following article: Zhang, Y., Lu, H. D., Yan, X. X., Cheng, X. X., Xie, L., Aoki, T., Li, L. Z., Heikes, C., Lau, S. P., Schlom, D. G., Chen, L. Q., Gruverman, A., Pan, X. Q., Intrinsic Conductance of Domain Walls in BiFeO3. Adv. Mater. 2019, 31(36), 1902099, which has been published in final form at https://doi.org/10.1002/adma.201902099. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions. This article may not be enhanced, enriched or otherwise transformed into a derivative work, without express permission from Wiley or by statutory rights under applicable legislation. Copyright notices must not be removed, obscured or modified. The article must be linked to Wiley’s version of record on Wiley Online Library and any embedding, framing or otherwise making available the article or pages thereof by third parties from platforms, services and websites other than Wiley Online Library must be prohibited.
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