Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/100240
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dc.contributorDepartment of Applied Physicsen_US
dc.creatorZhao, Yen_US
dc.creatorTang, Len_US
dc.creatorYang, Sen_US
dc.creatorTeng, KSen_US
dc.creatorLau, SPen_US
dc.date.accessioned2023-08-08T01:54:05Z-
dc.date.available2023-08-08T01:54:05Z-
dc.identifier.issn0146-9592en_US
dc.identifier.urihttp://hdl.handle.net/10397/100240-
dc.language.isoenen_US
dc.publisherOptical Society of Americaen_US
dc.rights© 2020 Optical Society of Americaen_US
dc.rights© 2020 Optica Publishing Group. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.en_US
dc.rightsThe following publication Zhao, Y., Tang, L., Yang, S., Teng, K. S., & Lau, S. P. (2020). Infrared photodetector based on GeTe nanofilms with high performance. Optics Letters, 45(5), 1108-1111 is available at https://doi.org/10.1364/OL.385280.en_US
dc.titleInfrared photodetector based on GeTe nanofilms with high performanceen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage1108en_US
dc.identifier.epage1111en_US
dc.identifier.volume45en_US
dc.identifier.issue5en_US
dc.identifier.doi10.1364/OL.385280en_US
dcterms.abstractGeTe is an important narrow band gap semiconductor material, which has found application in the fields of thermoelectricity, phase change storage as well as switch. However, it has not been studied for application in the field of photodetectors. Here, GeTe thin films were grown by magnetron sputtering and their material structure, optical and electrical properties were compared before and after annealing.High-performance photodetectors with detectivity of∼1013 Jones at 850 nm light were demonstrated. Thus the novel, to the best of our knowledge, application of GeTe in optoelectronic devices is reported in this work.en_US
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationOptics letters, 1 Mar. 2020, v. 45, no. 5, p. 1108-1111en_US
dcterms.isPartOfOptics lettersen_US
dcterms.issued2020-03-01-
dc.identifier.scopus2-s2.0-85080138488-
dc.identifier.pmid32108782-
dc.identifier.eissn1539-4794en_US
dc.description.validate202308 bcvcen_US
dc.description.oaAccepted Manuscripten_US
dc.identifier.FolderNumberAP-0221-
dc.description.fundingSourceOthersen_US
dc.description.fundingTextMeasurement Center of Yunnan Universityen_US
dc.description.pubStatusPublisheden_US
dc.identifier.OPUS22182395-
dc.description.oaCategoryGreen (AAM)en_US
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