Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/100220
| DC Field | Value | Language |
|---|---|---|
| dc.contributor | Department of Applied Physics | en_US |
| dc.creator | Du, H | en_US |
| dc.creator | Tu, M | en_US |
| dc.creator | Luo, S | en_US |
| dc.creator | Liu, Y | en_US |
| dc.creator | Qiu, X | en_US |
| dc.creator | Lu, H | en_US |
| dc.creator | Li, S | en_US |
| dc.creator | Yuan, S | en_US |
| dc.creator | Huang, W | en_US |
| dc.creator | Jie, W | en_US |
| dc.creator | Hao, J | en_US |
| dc.date.accessioned | 2023-08-08T01:53:51Z | - |
| dc.date.available | 2023-08-08T01:53:51Z | - |
| dc.identifier.issn | 0003-6951 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10397/100220 | - |
| dc.language.iso | en | en_US |
| dc.publisher | American Institute of Physics | en_US |
| dc.rights | © 2020 Author(s). | en_US |
| dc.rights | Published under license by AIP Publishing. | en_US |
| dc.rights | This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Huiying Du, Meilin Tu, Songwen Luo, Yuhuan Liu, Xinyue Qiu, Haipeng Lu, Shangdong Li, Shuoguo Yuan, Wen Huang, Wenjing Jie, Jianhua Hao; Reversible transition between bipolar resistive switching and threshold switching in 2D layered III–VI semiconductor GaSe. Appl. Phys. Lett. 22 June 2020; 116 (25): 253102 and may be found at https://doi.org/10.1063/5.0010498. | en_US |
| dc.title | Reversible transition between bipolar resistive switching and threshold switching in 2D layered III-VI semiconductor GaSe | en_US |
| dc.type | Journal/Magazine Article | en_US |
| dc.identifier.volume | 116 | en_US |
| dc.identifier.issue | 25 | en_US |
| dc.identifier.doi | 10.1063/5.0010498 | en_US |
| dcterms.abstract | Recently, two-dimensional (2D) layered materials have emerged as promising candidates for resistive switching (RS) devices. However, challenges in controllable conversion of RS types in such 2D materials still remain. Here, we report the experimental realization of reversible transition between non-volatile bipolar resistive switching (BRS) and volatile threshold switching (TS) in 2D layered III-VI semiconductor gallium selenide (GaSe) nanosheets through appropriately setting the compliance current (Icc). Under a relatively high Icc value of 1 mA, the device shows non-volatile BRS performance with a high ON/OFF ratio of nearly 104, a long retention time of 12 000 s, and a high endurance of 1200 switching cycles. Furthermore, under a relatively low Icc (lower than 10 μA), the volatile TS behaviors can be observed. For the former, the large Icc can generate stable conductive filaments (CFs) of Ga vacancy. Thus, the breakage of the stable CFs needs a high reverse voltage to re-align the Ga vacancy. For the latter, the low Icc generated unstable CFs can be broken by the current induced Joule heat. This study establishes the feasibility of integrating different RS types in 2D layered semiconductor nanosheets and understanding the underlying physical mechanism of different RS types in the 2D platform. | en_US |
| dcterms.accessRights | open access | en_US |
| dcterms.bibliographicCitation | Applied physics letters, 22 June 2020, v. 116, no. 25, 253102 | en_US |
| dcterms.isPartOf | Applied physics letters | en_US |
| dcterms.issued | 2020-06-22 | - |
| dc.identifier.scopus | 2-s2.0-85087542206 | - |
| dc.identifier.eissn | 1077-3118 | en_US |
| dc.identifier.artn | 253102 | en_US |
| dc.description.validate | 202308 bcvc | en_US |
| dc.description.oa | Version of Record | en_US |
| dc.identifier.FolderNumber | AP-0169 | - |
| dc.description.fundingSource | RGC | en_US |
| dc.description.fundingSource | Others | en_US |
| dc.description.fundingText | The National Natural Science Foundation of China;the Open Foundation of State Key Laboratory of Electronic Thin Films and Integrated Devices; the Open Foundation of National Engineering Research Center of Electromagnetic Radiation Control Materials; Sichuan Youth Science and Technology Foundation; the Key R&D Program of Sichuan Province | en_US |
| dc.description.pubStatus | Published | en_US |
| dc.identifier.OPUS | 25771677 | - |
| dc.description.oaCategory | VoR allowed | en_US |
| Appears in Collections: | Journal/Magazine Article | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 253102_1_online.pdf | 2.11 MB | Adobe PDF | View/Open |
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