Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/5081
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Title: Lattice orientation effect on the nanovoid growth in copper under shock loading
Authors: Zhu, W
Song, Z
Deng, X
He, H
Cheng, X
Issue Date: 1-Jan-2007
Source: Physical review. B, Condensed matter and materials physics, 1 Jan. 2007, v. 75, no. 2, 024104, p. 1-5
Abstract: Molecular-dynamics (MD) simulations have revealed that under shock loading a nanovoid in copper grows to be of ellipsoidal shape and different loading directions ([100] and [11̅ 1]) change the orientation of its major axis. This anisotropic growth is caused by preferential shear dislocation loop emission from the equator of the void under [100] loading and preferential shear dislocation loop emission deviating away from the equator under [11̅ 1] loading. A two-dimensional stress model has been proposed to explain the anisotropic plasticity. It is found that the loading direction changes the distribution of the resolved shear stress along the slip plane around the void and induces different dislocation emission mechanisms.
Keywords: Copper
Crystal orientation
Dislocation loops
Molecular dynamics method
Plasticity
Shock wave effects
Slip
Stress analysis
Voids (solid)
Publisher: American Physical Society
Journal: Physical review. B, Condensed matter and materials physics 
ISSN: 1098-0121
EISSN: 1550-235X
DOI: 10.1103/PhysRevB.75.024104
Rights: Physical Review B © 2007 The American Physical Society. The Journal's web site is located at http://prb.aps.org/
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