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Title: Deep multi-view feature learning for EEG-based epileptic seizure detection
Authors: Tian, X
Deng, Z
Ying, W
Choi, KS 
Wu, D
Qin, B
Wang, J
Shen, H
Wang, S
Issue Date: Oct-2019
Source: IEEE transactions on neural systems and rehabilitation engineering, Oct. 2019, v. 27, no. 10, 8832223, p. 1962-1972
Abstract: Epilepsy is a neurological illness caused by abnormal discharge of brain neurons, where epileptic seizure can lead to life-threatening emergencies. By analyzing the encephalogram (EEG) signals of patients with epilepsy, their conditions can be monitored and seizure can be detected and intervened in time. As the identification of effective features in EEG signals is important for accurate seizure detection, this paper proposes a multi-view deep feature extraction method in attempt to achieve this goal. The method first uses fast Fourier transform (FFT) and wavelet packet decomposition (WPD) to construct the initial multi-view features. Convolutional neural network (CNN) is then used to automatically learn deep features from the initial multi-view features, which reduces the dimensionality and obtain the features with better seizure identification ability. Furthermore, the multi-view Takagi-Sugeno-Kang fuzzy system (MV-TSK-FS), an interpretable rule-based classifier, is used to construct a classification model with strong generalizability based on the deep multi-view features obtained. Experimental studies show that the classification accuracy of the proposed multi-view deep feature extraction method is at least 1% higher than that of common feature extraction methods such as principal component analysis (PCA), FFT and WPD. The classification accuracy is also at least 4% higher than the average accuracy achieved with single-view deep features.
Keywords: EEG
Seizure detection
Multi-view
Feature extracting
Deep learning
Publisher: Institute of Electrical and Electronics Engineers
Journal: IEEE transactions on neural systems and rehabilitation engineering 
ISSN: 1534-4320
EISSN: 1558-0210
DOI: 10.1109/TNSRE.2019.2940485
Rights: © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
The following publication X. Tian et al., "Deep Multi-View Feature Learning for EEG-Based Epileptic Seizure Detection," in IEEE Transactions on Neural Systems and Rehabilitation Engineering, vol. 27, no. 10, pp. 1962-1972, Oct. 2019 is available at https://doi.org/10.1109/TNSRE.2019.2940485.
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