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http://hdl.handle.net/10397/93314
Title: | A third order exponential time differencing numerical scheme for no-slope-selection epitaxial thin film model with energy stability | Authors: | Cheng, K Qiao, Z Wang, C |
Issue Date: | Oct-2019 | Source: | Journal of scientific computing, Oct. 2019, v. 81, no. 1, p. 154-185 | Abstract: | In this paper we propose and analyze a (temporally) third order accurate exponential time differencing (ETD) numerical scheme for the no-slope-selection (NSS) equation of the epitaxial thin film growth model, with Fourier pseudo-spectral discretization in space. A linear splitting is applied to the physical model, and an ETD-based multistep approximation is used for time integration of the corresponding equation. In addition, a third order accurate Douglas-Dupont regularization term, in the form of -AΔt2ϕ0(LN)ΔN2(un+1-un), is added in the numerical scheme. A careful Fourier eigenvalue analysis results in the energy stability in a modified version, and a theoretical justification of the coefficient A becomes available. As a result of this energy stability analysis, a uniform in time bound of the numerical energy is obtained. And also, the optimal rate convergence analysis and error estimate are derived in details, in the ℓ∞(0,T;Hh1)∩ℓ2(0,T;Hh3) norm, with the help of a careful eigenvalue bound estimate, combined with the nonlinear analysis for the NSS model. This convergence estimate is the first such result for a third order accurate scheme for a gradient flow. Some numerical simulation results are presented to demonstrate the efficiency of the numerical scheme and the third order convergence. The long time simulation results for ε= 0.02 (up to T= 3 × 10 5) have indicated a logarithm law for the energy decay, as well as the power laws for growth of the surface roughness and the mound width. In particular, the power index for the surface roughness and the mound width growth, created by the third order numerical scheme, is more accurate than those produced by certain second order energy stable schemes in the existing literature. | Keywords: | Aliasing error Energy stability Epitaxial thin film growth Exponential time differencing Optimal rate convergence analysis Slope selection |
Publisher: | Springer | Journal: | Journal of scientific computing | ISSN: | 0885-7474 | DOI: | 10.1007/s10915-019-01008-y | Rights: | © Springer Science+Business Media, LLC, part of Springer Nature 2019 This version of the article has been accepted for publication, after peer review (when applicable) and is subject to Springer Nature’s AM terms of use (https://www.springernature.com/gp/open-research/policies/accepted-manuscript-terms), but is not the Version of Record and does not reflect post-acceptance improvements, or any corrections. The Version of Record is available online at: http://dx.doi.org/10.1007/s10915-019-01008-y |
Appears in Collections: | Journal/Magazine Article |
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Qiao_Third_Order_Exponential.pdf | Pre-Published version | 1.12 MB | Adobe PDF | View/Open |
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