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Title: Surface defect analysis on formed chalcogenide glass Ge22Se58As20 lenses after the molding process
Authors: Zhou, T
Zhou, Q
Xie, J
Liu, X
Wang, X
Ruan, H 
Issue Date: 20-Oct-2017
Source: Applied optics, 20 Oct. 2017, v. 56, no. 30, p. 8394-8402
Abstract: Chalcogenide glass (ChG) is increasingly used in infrared optical systems owing to its excellent infrared optical properties and scalable production using precision glass molding (PGM). However, surface scratches affected by the molding temperature and microdimples on the lens surface caused by gas release seriously impair the quality of the formed lens. To reduce these surface defects when molding Ge22Se58As20 ChG, the temperature effect must be studied, and the gas generation must be minimized, while the gas escape must be maximized. In this work, we studied the effect of temperature on the surface defects. Additionally, we studied the influences of the roughness and curvature of the contact surfaces, as well as the pressing force on the formation of the microdimples. It was found that the molding temperature should be approximately 30 degrees C higher than the softening temperature (T-s) to avoid surface scratches. The gas generation could be inhibited by increasing the pressing force and decreasing the roughness of the mold surface, and finally, increasing the curvature difference between the mold and glass preform surfaces improved the gas escape.
Publisher: Optical Society of America
Journal: Applied optics 
ISSN: 1559-128X
EISSN: 2155-3165
DOI: 10.1364/AO.56.008394
Rights: © 2017 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.
The following publication Zhou, T., Zhou, Q., Xie, J., Liu, X., Wang, X., & Ruan, H. (2017). Surface defect analysis on formed chalcogenide glass Ge 22 Se 58 As 20 lenses after the molding process. Applied Optics, 56(30), 8394-8402 is available at https://doi.org/10.1364/AO.56.008394
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