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Title: Detecting land subsidence in Shanghai by PS-networking SAR interferometry
Authors: Liu, G
Luo, X
Chen, Q
Huang, D
Ding, XL 
Issue Date: 2008
Source: Sensors, Aug 2008, v. 8, no. 8, p. 4725-4741
Abstract: Existing studies have shown that satellite synthetic aperture radar (SAR) interferometry has two apparent drawbacks, i.e., temporal decorrelation and atmospheric contamination, in the application of deformation mapping. It is however possible to improve deformation analysis by tracking some natural or man-made objects with steady radar reflectivity, i.e., permanent scatterers (PS), in the frame of time series of SAR images acquired over the same area. For detecting land subsidence in Shanghai, China, this paper presents an attempt to explore an approach of PS-neighborhood networking SAR interferometry. With use of 26 ERS-1/2 SAR images acquired 1992 through 2002 over Shanghai, the analysis of subsiding process in time and space is performed on the basis of a strong network which is formed by connecting neighboring PSs according to a distance threshold. The linear and nonlinear subsidence, atmospheric effects as well as topographic errors can be separated effectively in this way. The subsidence velocity field in 10 years over Shanghai is also derived. It was found that the annual subsidence rates in the study area range from -2.1 to -0.6 cm/yr, and the averaged subsidence rate reaches -1.1 cm/yr.
Keywords: Permanent scatter
PS networking
Radar interferometry
Subsidence detection
Publisher: Molecular Diversity Preservation International (MDPI)
Journal: Sensors 
EISSN: 1424-8220
DOI: 10.3390/s8084725
Rights: © 2008 by the authors; licensee Molecular Diversity Preservation International, Basel, Switzerland. This article is an open-access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/). The following publication Liu, G., Luo, X., Chen, Q., Huang, D., & Ding, X. (2008). Detecting land subsidence in shanghai by PS-networking SAR interferometry. Sensors, 8(8), 4725-4741 is available at http://dx.doi.org/10.3390/s8084725
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