Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/6582
Title: Modelling the effect of plastic anisotropy on springback of integrated circuit leadframes
Authors: Chan, KC 
Wang, SH
Keywords: Anisotropy
Integrated circuit leadframe
Roller forming
Crystallographic mechanics of textured polycrystals
Issue Date: 1998
Publisher: Hindawi Publishing Corporation
Source: Texture and microstructures, 1998, v. 31, no. 1-2, p. 85-95 How to cite?
Journal: Texture and microstructures 
Abstract: Recently, some published experimental results have revealed that springback of some common types of integrated circuit (IC) leadframes in roller forming is highly related to their anisotropic properties. In this paper, a new plane stress bending model based on the approach of Crystallographic Mechanics of Textured Polycrystals (CMTP) has been developed to predict the deformation behaviour and springback of a copper alloy. Based on the texture data obtained from the measured orientation distribution function, springback of the copper alloy in the rolling direction was determined to be greater than that perpendicular to the rolling direction. It was also found that the springback increased with increasing die radius. The predictions were compared to the experimental findings, and the trends of them were in reasonable agreement.
URI: http://hdl.handle.net/10397/6582
ISSN: 0730-3300
DOI: 10.1155/TSM.31.85
Rights: Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
Appears in Collections:Journal/Magazine Article

Files in This Item:
File Description SizeFormat 
Chan_Plastic_Anisotropy_Springback.pdf644.66 kBAdobe PDFView/Open
Access
View full-text via PolyU eLinks SFX Query
Show full item record

Page view(s)

109
Last Week
2
Last month
Checked on Nov 19, 2017

Download(s)

47
Checked on Nov 19, 2017

Google ScholarTM

Check

Altmetric



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.