Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/6051
Title: Mapping plasmonic near-field profiles and interferences by surface-enhanced Raman scattering
Authors: Du, L
Lei, DY 
Yuan, G
Fang, H
Zhang, X
Wang, Q
Tang, D
Min, C
Maier, SA
Yuan, X
Keywords: Microscopy
Nanophotonics and plasmonics
Issue Date: 29-Oct-2013
Publisher: Nature Publishing Group
Source: Scientific reports, 29 Oct. 2013, 3, 3064 How to cite?
Journal: Scientific reports 
Abstract: Mapping near-field profiles and dynamics of surface plasmon polaritons is crucial for understanding their fundamental optical properties and designing miniaturized photonic devices. This requires a spatial resolution on the sub-wavelength scale because the effective polariton wavelength is shorter than free-space excitation wavelengths. Here by combining total internal reflection excitation with surface-enhanced Raman scattering imaging, we mapped at the sub-wavelength scale the spatial distribution of the dominant perpendicular component of surface plasmon fields in a metal nanoparticle-film system through spectrally selective and polarization-resolved excitation of the vertical gap mode. The lateral field-extension at the junction, which is determined by the gap-mode volume, is small enough to distinguish a spot size,0.355λ₀ generated by a focused radially polarized beam with high reproducibility. The same excitation and imaging schemes are also used to trace near-field nano-focusing and interferences of surface plasmon polaritons created by a variety of plasmon lenses.
URI: http://hdl.handle.net/10397/6051
DOI: 10.1038/srep03064
Rights: Du, L. et al. Mapping plasmonic near-field profiles and interferences by surface-enhanced Raman scattering. Sci. Rep. 3, 3064; DOI:10.1038/srep03064 (2013).
This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported license. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-nd/3.0
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