Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/6040
Title: Efficient rotation- and scale-invariant texture analysis
Authors: Fung, KK
Lam, KMK 
Keywords: Feature extraction
Image processing
Image retrieval
Textures
Issue Date: Oct-2010
Publisher: SPIE-International Society for Optical Engineering
Source: Journal of electronic imaging, Oct 2010, v. 19, no. 4, 043005, p. 1-16 How to cite?
Journal: Journal of electronic imaging 
Abstract: Texture analysis plays an important role in content-based image retrieval and other areas of image processing. It is often desirable for the texture classifier to be rotation and scale invariant. Furthermore, to enable real-time usage, it is desirable to perform the classification efficiently. Toward these goals, we propose several enhancements to the multiresolution Gabor analysis. The first is a new set of kernels called Slit, which can replace Gabor wavelets in applications where high computational speed is desired. Compared to Gabor, feature extraction using Slit requires only 11 to 17% of the numeric operations. The second is to make the features more rotation invariant. We propose a circular sum of the feature elements from the same scale of the feature vector. This has the effect of averaging the feature vector from all orientations. The third is a slide-matching scheme for the final stage of the classifier, which can be applied to different types of distance measures. Distances are calculated at slightly different scales, and the smallest value is used as the actual distance measures. Experimental results using different image databases and distance measures show distinct improvements over existing schemes.
URI: http://hdl.handle.net/10397/6040
ISSN: 1017-9909
EISSN: 1560-229X
DOI: 10.1117/1.3495999
Rights: Fung K and Lam K, "Efficient rotation- and scale-invariant texture analysis," J. Electron. Imaging., 19(4), 043005, p. 1-16 (2010)
Copyright 2010 Society of Photo-Optical Instrumentation Engineers & Society for Imaging Science and Technology. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
http://dx.doi.org/10.1117/1.3495999
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