Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/536
Title: | Probing deep level centers in GaN epilayers with variable-frequency capacitance-voltage characteristics of Au/GaN Schottky contacts | Authors: | Wang, RX Xu, SJ Shi, SL Beling, CD Fung, S Zhao, DG Yang, H Tao, X |
Issue Date: | 3-Oct-2006 | Source: | Applied physics letters, 3 Oct. 2006, v. 89, no. 14, 143505, p. 1-3 | Abstract: | Under identical preparation conditions, Au/GaN Schottky contacts were prepared on two kinds of GaN epilayers with significantly different background electron concentrations and mobility as well as yellow emission intensities. Current-voltage (I-V) and variable-frequency capacitance-voltage (C-V) characteristics show that the Schottky contacts on the GaN epilayer with a higher background carrier concentration and strong yellow emission exhibit anomalous reverse-bias I-V and C-V characteristics. This is attributed to the presence of deep level centers. Theoretical simulation of the low-frequency C-V curves leads to a determination of the density and energy level position of the deep centers. | Keywords: | Gallium compounds Gold III-V semiconductors Wide band gap semiconductors Semiconductor epitaxial layers Schottky barriers Semiconductor-metal boundaries Deep levels Electron density Electron mobility Photoluminescence Capacitance Electrical conductivity Semiconductor growth |
Publisher: | American Institute of Physics | Journal: | Applied physics letters | ISSN: | 0003-6951 | EISSN: | 1077-3118 | Rights: | © 2006 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in R.X. Wang et al., Appl. Phys. Lett. 89, 143505 (2006) and may be found at http://link.aip.org/link/?apl/89/143505 |
Appears in Collections: | Journal/Magazine Article |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
capacitance-voltage_06.pdf | 256.96 kB | Adobe PDF | View/Open |
Page views
147
Last Week
1
1
Last month
Citations as of Mar 24, 2024
Downloads
182
Citations as of Mar 24, 2024
SCOPUSTM
Citations
22
Last Week
0
0
Last month
0
0
Citations as of Mar 29, 2024
WEB OF SCIENCETM
Citations
20
Last Week
0
0
Last month
0
0
Citations as of Mar 28, 2024
Google ScholarTM
Check
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.