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Title: Characteristic analysis of coupled microstrip patch resonators on ferrimagnetic substrates
Authors: Sun, K
Chen, Y
Barry, W
Corlett, J
Keywords: Microstrip lines
Ferrimagnetic materials
Yttrium oxides
Gadolinium oxides
Gallium oxides
Iron oxides
Microwave equipment
Thin films
Computerized simulation
Issue Date: 15-Apr-1996
Publisher: American Institute of Physics
Source: Journal of applied physics, 15 Apr. 1996, v. 79, no. 8, p. 5733-5735 How to cite?
Journal: Journal of applied physics 
Abstract: This paper is to use the spectral-domain technique to perform characteristic analysis of coupled microstrip patch resonators on ferrimagnetic substrates. Our formulation has been validated by comparing our result with the published data and showing an excellent agreement between them. Numerical computations have been performed to obtain dependence of resonant frequency on patch dimensions, offset and separation between the two patches, thicknesses of ferrimagnetic film and substrate. It has been seen that as the length of the patch increases the resonant frequency decreases. The larger the offset between the two patches the lower the resonant frequency. The separation between the two patches strongly affects the resonant frequency. It is also found that the resonant frequency increases as the width of the patch decreases. For the fixed dimensions, separation and offset, a thinner substrate results in a higher resonant frequency, and in contrast, a thinner ferrimagnetic film results in a lower resonant frequency.
ISSN: 0021-8979
EISSN: 1089-7550
DOI: 10.1063/1.362234
Rights: © 1996 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in K. Sun et al., J. Appl. Phys. 79, 5733 (1996) and may be found at
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