Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/4881
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dc.contributorDepartment of Applied Physics-
dc.contributorMaterials Research Centre-
dc.creatorLi, JL-
dc.creatorHao, JH-
dc.creatorLi, YR-
dc.date.accessioned2014-12-11T08:24:49Z-
dc.date.available2014-12-11T08:24:49Z-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10397/4881-
dc.language.isoenen_US
dc.publisherAmerican Institute of Physicsen_US
dc.rights© 2007 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in J. L. Li, J. H. Hao & Y. R. Li, Appl. Phys. Lett. 91, 131902 (2007) and may be found at http://link.aip.org/link/?apl/91/131902en_US
dc.subjectDiffusionen_US
dc.subjectFerroelectric thin filmsen_US
dc.subjectInterface phenomenaen_US
dc.subjectLaser materials processingen_US
dc.subjectMolecular beam epitaxial growthen_US
dc.subjectReflection high energy electron diffractionen_US
dc.subjectStrontium compoundsen_US
dc.subjectX-ray diffractionen_US
dc.titleImprovement of laser molecular beam epitaxy grown SrTiO₃ thin film properties by temperature gradient modulation growthen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.spage1-
dc.identifier.epage3-
dc.identifier.volume91-
dc.identifier.issue13-
dc.identifier.doi10.1063/1.2790074-
dcterms.abstractOxygen diffusion at the SrTiO₃/Si interface was analyzed. A method called temperature gradient modulation growth was introduced to control oxygen diffusion at the interface of SrTiO₃/Si. Nanoscale multilayers were grown at different temperatures at the initial growing stage of films. Continuous growth of SrTiO₃ films was followed to deposit on the grown sacrificial layers. The interface and crystallinity of SrTiO₃/Si were investigated by in situ reflection high energy electron diffraction and x-ray diffraction measurements. It has been shown that the modulated multilayers may help suppress the interfacial diffusion, and therefore improve SrTiO₃ thin film properties.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationApplied physics letters, 24 Sept. 2007, v. 91, no. 13, 131902, p. 1-3-
dcterms.isPartOfApplied physics letters-
dcterms.issued2007-09-24-
dc.identifier.isiWOS:000249787000025-
dc.identifier.scopus2-s2.0-34848852932-
dc.identifier.eissn1077-3118-
dc.identifier.rosgroupidr38455-
dc.description.ros2007-2008 > Academic research: refereed > Publication in refereed journal-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
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