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http://hdl.handle.net/10397/487
| Title: | Microstructure study of Bi₄Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] and Bi[sub 3.25]La[sub 0.75]Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] ceramics | Authors: | Su, D Zhu, JS Wang, D Chan, HLW Choy, CL Wang, Y |
Issue Date: | 2002 | Source: | ISAF 2002 : proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics : Nara, Japan, May 28-June 1, 2002, p. 71-74 | Abstract: | TEM study is preformed on mixed-layer type Bismuth compounds: Bi₄Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] (BT-SBTi) and Bi[sub 3.25]La[sub 0.75]Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] (BLT-SBTi) ceramics. Meeting the prediction of space group theory, APBs and 90° domain wall are observed by bright- and dark-field imaging in both materials. Besides, other planer defects are found and confirmed to be stacking faults. | Keywords: | Bismuth compounds Ferroelectricity Ferroelectric thin films |
Publisher: | IEEE | ISBN: | 0-7803-7414-2 | ISSN: | 1099-4734 | Rights: | © 2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. |
| Appears in Collections: | Conference Paper |
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