Please use this identifier to cite or link to this item: http://hdl.handle.net/10397/487
PIRA download icon_1.1View/Download Full Text
DC FieldValueLanguage
dc.contributorDepartment of Applied Physics-
dc.creatorSu, D-
dc.creatorZhu, JS-
dc.creatorWang, D-
dc.creatorChan, HLW-
dc.creatorChoy, CL-
dc.creatorWang, Y-
dc.date.accessioned2014-12-11T08:23:55Z-
dc.date.available2014-12-11T08:23:55Z-
dc.identifier.isbn0-7803-7414-2-
dc.identifier.issn1099-4734-
dc.identifier.urihttp://hdl.handle.net/10397/487-
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.rights© 2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_US
dc.rightsThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.subjectBismuth compoundsen_US
dc.subjectFerroelectricityen_US
dc.subjectFerroelectric thin filmsen_US
dc.titleMicrostructure study of Bi₄Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] and Bi[sub 3.25]La[sub 0.75]Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] ceramicsen_US
dc.typeConference Paperen_US
dcterms.abstractTEM study is preformed on mixed-layer type Bismuth compounds: Bi₄Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] (BT-SBTi) and Bi[sub 3.25]La[sub 0.75]Ti₃O₁₂ - SrBi₄Ti₄O[sub 15] (BLT-SBTi) ceramics. Meeting the prediction of space group theory, APBs and 90° domain wall are observed by bright- and dark-field imaging in both materials. Besides, other planer defects are found and confirmed to be stacking faults.-
dcterms.accessRightsopen accessen_US
dcterms.bibliographicCitationISAF 2002 : proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics : Nara, Japan, May 28-June 1, 2002, p. 71-74-
dcterms.issued2002-
dc.identifier.scopus2-s2.0-0038341922-
dc.identifier.rosgroupidr09910-
dc.description.ros2001-2002 > Academic research: refereed > Refereed conference paper-
dc.description.oaVersion of Recorden_US
dc.identifier.FolderNumberOA_IR/PIRAen_US
dc.description.pubStatusPublisheden_US
Appears in Collections:Conference Paper
Files in This Item:
File Description SizeFormat 
microstructure_conf_02.pdf309.29 kBAdobe PDFView/Open
Open Access Information
Status open access
File Version Version of Record
Access
View full-text via PolyU eLinks SFX Query
Show simple item record

Page views

95
Last Week
0
Last month
Citations as of Apr 14, 2024

Downloads

63
Citations as of Apr 14, 2024

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.