Please use this identifier to cite or link to this item:
http://hdl.handle.net/10397/424
DC Field | Value | Language |
---|---|---|
dc.contributor | Department of Applied Physics | - |
dc.creator | Yuan, GL | - |
dc.creator | Liu, J | - |
dc.creator | Zhang, ST | - |
dc.creator | Wu, D | - |
dc.creator | Wang, YP | - |
dc.creator | Liu, Z | - |
dc.creator | Chan, HLW | - |
dc.creator | Choy, CL | - |
dc.date.accessioned | 2014-12-11T08:27:44Z | - |
dc.date.available | 2014-12-11T08:27:44Z | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/10397/424 | - |
dc.language.iso | en | en_US |
dc.publisher | American Institute of Physics | en_US |
dc.rights | © 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in G.L. Yuan et al. Appl. Phys. Lett. 84, 954 (2004) and may be found at http://link.aip.org/link/?apl/84/954 | en_US |
dc.subject | Strontium compounds | en_US |
dc.subject | Bismuth compounds | en_US |
dc.subject | Ferroelectric materials | en_US |
dc.subject | Ferroelectric switching | en_US |
dc.subject | Ferroelectric thin films | en_US |
dc.subject | Fatigue | en_US |
dc.subject | Dielectric hysteresis | en_US |
dc.subject | Pulsed laser deposition | en_US |
dc.title | Low-temperature switching fatigue behavior of ferroelectric SrBi₂Ta₂O[sub 9] thin films | en_US |
dc.type | Journal/Magazine Article | en_US |
dc.description.otherinformation | Author name used in this publication: Z. G. Liu | en_US |
dc.description.otherinformation | Author name used in this publication: H. L. W. Chan | en_US |
dc.description.otherinformation | Author name used in this publication: C. L. Choy | en_US |
dc.identifier.spage | 954 | - |
dc.identifier.epage | 956 | - |
dc.identifier.volume | 84 | - |
dc.identifier.issue | 6 | - |
dcterms.abstract | The ferroelectric hysteresis and fatigue behavior over a wide temperature range from 290 to 50 K for SrBi₂Ta₂O[sub 9] thin films with Pt electrodes on silicon substrates, prepared by metalorganic decomposition (MOD) and pulsed-laser deposition (PLD), are investigated. It is found that given a fixed electrical field amplitude, the coercivity of all films increases with decreasing temperature T. The saturated hysteresis loop easily obtained for the MOD-prepared thin films has its remnant polarization enhanced with decreasing T, but the PLD-prepared samples exhibit minor loops whose remnant polarization decays with decreasing T. While the films prepared by MOD exhibit improved fatigue resistance at low T, significant fatigue effect at low T is observed for the films prepared by PLD. Although we cannot rule out the effect of strain, the experimental results can be explained by competition between pinning and depinning of domain walls, which are dependent of temperature and defect charges. | - |
dcterms.accessRights | open access | en_US |
dcterms.bibliographicCitation | Applied physics letters, 9 Feb. 2004, v. 84, no. 6, p. 954-956 | - |
dcterms.isPartOf | Applied physics letters | - |
dcterms.issued | 2004-02-09 | - |
dc.identifier.isi | WOS:000188763800040 | - |
dc.identifier.scopus | 2-s2.0-1542366719 | - |
dc.identifier.eissn | 1077-3118 | - |
dc.identifier.rosgroupid | r17106 | - |
dc.description.ros | 2003-2004 > Academic research: refereed > Publication in refereed journal | - |
dc.description.oa | Version of Record | en_US |
dc.identifier.FolderNumber | OA_IR/PIRA | en_US |
dc.description.pubStatus | Published | en_US |
Appears in Collections: | Journal/Magazine Article |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
fatigue_behavior_04.pdf | 85.37 kB | Adobe PDF | View/Open |
Page views
107
Last Week
2
2
Last month
Citations as of Apr 21, 2024
Downloads
97
Citations as of Apr 21, 2024
SCOPUSTM
Citations
30
Last Week
0
0
Last month
0
0
Citations as of Apr 26, 2024
WEB OF SCIENCETM
Citations
30
Last Week
0
0
Last month
0
0
Citations as of Apr 25, 2024
Google ScholarTM
Check
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.